# US 10,768,226 B2 · Testing mechanism for a proximity fail probability of defects across integrated chips > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 10,768,226 B2 - Document ID: US10768226B2 - Status: Granted - Kind: B2 - Application number: 16/117,931 - Filed: 2018-08-30 - Published: 2018-12-27 - Granted: 2020-09-08 - Earliest claimed: 2016-04-26 - Assignees: International Business Machines Corporation - Applicants: International Business Machines Corporation - Inventors: Kirk D. Peterson; Alain G. Rwabukamba; Andrew A. Turner - Web page: https://patentgrep.com/patent/US10768226B2 ## CPC - G01R 31/31703: {Comparison aspects, e.g. signature analysis, comparators (concerning scan tests G01R31/318566; concerning testers G01R31/3193)} - G01R 31/31707: {Test strategies (methods for generation of test sequences G01R31/318371)} - G01R 31/3177: Testing of logic operation, e.g. by logic analysers - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) ## Abstract According to an embodiment, a testing mechanism determines a status of circuits within a chip by analyzing fail signatures on a by-level basis to identify a high probability defect area within the chip. The testing mechanism further determines a whether functionally needed circuitry of the chip intersects with the high probability defect area within the chip and determines the status of the circuits in response to the determining of whether the functionally needed circuitry intersects with the high probability defect area. ## Claims ### Claim 1 A method for determining a status of circuitry within a chip by a testing mechanism, the method comprising: collecting, by the testing mechanism, fail signatures from portions of the circuitry within the chip to determine the status of the circuitry within a chip, where the fail signatures evidence lack of operability for the portions of the circuitry within the chip; analyzing, by the testing mechanism, the fail signatures on a by-level basis to identify a high probability defect area within the chip by statistically determining by-level fail probabilities based on a plurality of signal types of the fail signatures, by associating confidence scores with the by-level fail probabilities, and by determining the chip to be a bad chip with respect to whether the by-level fail probabilities and the confidence scores indicate the status of the circuitry to be bad; determining, by the testing mechanism, whether functionally needed circuitry of the chip intersects with the high probability defect area within the chip; and determining, by the testing mechanism, the status of the circuitry in response to the determining of whether the functionally needed circuitry intersects with the high probability defect area. ### Claim 2 (depends on 1) The method of claim 1, wherein the determining of the by-level fail probabilities comprises statistically determining one or more by-level fail probabilities based on tracing diagnostics of the fail signatures. ### Claim 3 (depends on 1) The method of claim 1, wherein the high probability defect area comprises a defect and a disposition of near-by circuits. ### Claim 4 (depends on 1) The method of claim 1, wherein the testing mechanism determines a mitigation availability of the high probability defect area when the functionally needed circuitry intersects with the high probability defect area. ### Claim 5 (depends on 4) The method of claim 4, wherein the status of the circuitry is determined as a bad status if the high probability defect area cannot be mitigated. ### Claim 6 (depends on 4) The method of claim 4, wherein the status of the circuitry is determined as a defective status if the high probability defect area can be mitigated. ### Claim 7 (depends on 1) The method of claim 1, wherein the testing mechanism determines the status of the circuitry as a good status when the functionally needed circuitry does not intersect with the high probability defect area. ### Claim 8 (depends on 1) The method of claim 1, wherein the chip comprises a semiconductor wafer including one or more levels on which one or more resistors, one or more capacitors, and one or more transistors are fabricated to provide the circuitry, each of the one or more levels being a structural portion of the chip itself. ### Claim 9 (depends on 1) The method of claim 1, wherein the signal types comprise array repair, logic faults, and parametric outliners. ### Claim 10 (depends on 1) The method of claim 1, wherein the confidence score an agreement level between multiple by-level fail probabilities reflecting a likelihood of circuit or chip failures due to defects. ### Claim 11 A computer program product, the computer program product comprising a computer readable storage medium having program instructions of a testing mechanism for determining a status of circuitry within a chip embodied therewith, the program instructions executable by a processor to cause the processor to perform: collecting, by the testing mechanism, fail signatures from portions of the circuitry within the chip to determine the status of the circuitry within a chip, where the fail signatures evidence lack of operability for the portions of the circuitry within the chip; analyzing the fail signatures on a by-level basis to identify a high probability defect area within the chip by statistically determining by-level fail probabilities based on a plurality of signal types of the fail signatures, by associating confidence scores with the by-level fail probabilities, and by determining the chip to be a bad chip with respect to whether the by-level fail probabilities and the confidence scores indicate the status of the circuitry to be bad; determining whether functionally needed circuitry of the chip intersects with the high probability defect area within the chip; and determining the status of the circuitry in response to the determining of whether the functionally needed circuitry intersects with the high probability defect area. ### Claim 12 (depends on 11) The computer program product of claim 11, wherein the high probability defect area comprises a defect and a disposition of near-by circuits. ### Claim 13 (depends on 11) The computer program product of claim 11, wherein the testing mechanism determines a mitigation availability of the high probability defect area when the functionally needed circuitry intersects with the high probability defect area. ### Claim 14 (depends on 11) The computer program product of claim 11, wherein the testing mechanism determines the status of the circuitry as a good status when the functionally needed circuitry does not intersect with the high probability defect area. ### Claim 15 A system, comprising a processor and a memory storing program instructions of testing mechanism for determining a status of circuitry within a chip thereon, the program instructions executable by a processor to cause the system to perform: collecting, by the testing mechanism, fail signatures from portions of the circuitry within the chip to determine the status of the circuitry within a chip, where the fail signatures evidence lack of operability for the portions of the circuitry within the chip; analyzing the fail signatures on a by-level basis to identify a high probability defect area within the chip by statistically determining by-level fail probabilities based on a plurality of signal types of the fail signatures, by associating confidence scores with the by-level fail probabilities, and by determining the chip to be a bad chip with respect to whether the by-level fail probabilities and the confidence scores indicate the status of the circuitry to be bad; determining whether functionally needed circuitry of the chip intersects with the high probability defect area within the chip; and determining the status of the circuitry in response to the determining of whether the functionally needed circuitry intersects with the high probability defect area. ### Claim 16 (depends on 15) The system of claim 15, wherein the high probability defect area comprises a defect and a disposition of near-by circuits.