# US 10,768,219 B2 · Method and apparatus for flexure testing of electronic components > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 10,768,219 B2 - Document ID: US10768219B2 - Status: Granted - Kind: B2 - Application number: 16/013,575 - Filed: 2018-06-20 - Published: 2019-12-26 - Granted: 2020-09-08 - Earliest claimed: 2018-06-20 - Assignees: DISH Network L.L.C. - Applicants: Dish Network L.L.C. - Inventors: Kirk Lenzie; Jamie Metzger; Kenneth Jones; Matthew Bailey - Web page: https://patentgrep.com/patent/US10768219B2 ## CPC - G01R 31/2808: {Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards (probe, multiprobe, probe manipulator or probe fixture G01R1/067)} - G01R 31/2817: {Environmental-, stress-, or burn-in tests (of IC's G01R31/2855; of individual semiconductors G01R31/2642; of other circuits G01R31/2849)} - H05K 1/0268: {for electrical inspection or testing} - H05K 1/189: characterised by the use of flexible or folded printed circuits - G01N 3/20: by applying steady bending forces (G01N3/26, G01N3/28 take precedence) - G01N 2203/0282: Two dimensional, e.g. tapes, webs, sheets, strips, disks or membranes - G01R 1/0408: {Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets (G01R1/067 takes precedence; mass production testing systems G01R31/59; testing of connections G01R31/66; for testing printed circuit boards G01R31/2808)} - G01R 31/2806: {Apparatus therefor, e.g. test stations, drivers, analysers, conveyors (G01R31/2805, G01R31/281, G01R31/2818 take precedence)} - H05K 2201/10015: Non-printed capacitor - H05K 2201/10022: Non-printed resistor - H05K 2201/1003: Non-printed inductor - H05K 2201/10166: Transistor - H05K 2201/10522: Adjacent components - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) - H05K: PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS - G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q) ## Abstract Disclosed herein is a method and apparatus for testing the response of electrical circuits to being flexed. Support members, preferably at least two, are positioned to receive the electrical circuits to be tested. The support members are spaced apart from each other to permit the electrical circuit to be flexed between the two support members. A plunger, having an arcuate front face is positioned between the support members. The plunger is depressed, flexing the electrical circuit a selected amount. After the circuit has been flexed a selected amount, the circuit is tested to determine whether or not it is fully operational after being flexed. ## Claims ### Claim 1 A method of operational integrity testing a plurality of electronic components comprising: placing a plurality of electronic components at respective, selected locations on a printed circuit board, each of the electronic components being spaced from each other; placing the printed circuit board in a flexure test fixture; pressing a plunger into the printed circuit board, the plunger having a surface area approximately equal to the surface area of the printed circuit board and contacting the printed circuit board at multiple locations, the plunger further including a single arcuate face surface and a stop member; continuing to press the plunger into the printed circuit board to cause the printed circuit board to flex until the printed circuit board reaches a selected bent position and the stop member halts further movement of the plunger; and testing the operational integrity of the electric components after the plunger has moved a selected distance, wherein if the electric components are fully electrically functional after the plunger has moved the selected distance, then the electric components are determined to have passed the test. ### Claim 2 (depends on 1) The method according to claim 1 wherein the step of testing the operational integrity of the electric components occurs while the printed circuit board is in the selected bent position. ### Claim 3 (depends on 2) The method according to claim 2 wherein the step of testing the operational integrity of the electric components occurs after the flexure has been removed from the printed circuit board. ### Claim 4 (depends on 1) The method according to claim 1 further including: retracting the plunger to remove a flexure from the printed circuit board. ### Claim 5 (depends on 1) The method according to claim 1 wherein the plunger has an arcuate face that contacts the printed circuit board. ### Claim 6 A testing fixture comprising: a housing; a plurality of support members positioned within the housing and spaced apart from each other; a plunger having a single arcuate front face, the plunger being positioned between the support members, the plunger further including a stop member; a guide member coupled to the plunger; and a socket coupled to the housing and configured to receive the guide member, wherein the stop member limits movement of the plunger. ### Claim 7 (depends on 6) The fixture according to claim 6 further including: an open space between the support members and positioned under the plunger configured to receive the plunger. ### Claim 8 (depends on 7) The fixture according to claim 7 further including: a drive shaft connected to the plunger and configured to drive the plunger into the open space. ### Claim 9 (depends on 6) The fixture according to claim 6 wherein the stop member is positioned on the guide member. ### Claim 10 (depends on 9) The fixture according to claim 9 further including: a blocking member on the housing that contacts the stop member when the plunger is fully depressed to a correct position in the housing. ### Claim 11 (depends on 6) The fixture according to claim 6 further including a printed circuit board positioned within the housing and wherein an electrical circuit to be tested includes a printed circuit board having a plurality of electronic components positioned thereon. ### Claim 12 (depends on 11) The fixture according to claim 11 wherein the electronic components are arranged in horizontal rows. ### Claim 13 (depends on 12) The fixture according to claim 12 further including a plurality of test pads coupled to the printed circuit board, each test pad being coupled to plurality of the electronic components. ### Claim 14 (depends on 13) The fixture according to claim 13 wherein each row of the electronic components has two test pads coupled to that row. ### Claim 15 (depends on 11) The fixture according to claim 11 further wherein the electronic components are arranged in columns, the columns having an accurate shape. ### Claim 16 (depends on 6) The fixture according to claim 6 further including a printed circuit board positioned within the housing and wherein an electrical circuit to be tested includes a passive electrical component mounted on the printed circuit board. ### Claim 17 (depends on 6) The fixture according to claim 6 further including a printed circuit board positioned within the housing and wherein an electrical circuit to be tested includes an integrated circuit having transistors therein, the integrated circuit being mounted to the printed circuit board.