# US 10,768,214 B2 · Multi-view planar near-field scattering tomography system

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- Number: US 10,768,214 B2
- Document ID: US10768214B2
- Status: Granted
- Kind: B2
- Application number: 15/699,051
- Filed: 2017-09-08
- Published: 2018-03-15
- Granted: 2020-09-08
- Earliest claimed: 2016-09-09
- Assignees: OZ Optics Ltd.
- Applicants: OZ Optics Ltd.
- Inventors: Safieddin Safavi-Naeini; Shahed Shahir
- Web page: https://patentgrep.com/patent/US10768214B2

## CPC

- G01R 27/32: in circuits having distributed constants {, e.g. having very long conductors or involving high frequencies}
- G01N 22/00: Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more (G01N3/00 - G01N17/00, G01N24/00 take precedence)
- G01R 27/06: Measuring reflection coefficients; Measuring standing-wave ratio
- G01R 29/0821: {rooms and test sites therefor, e.g. anechoic chambers, open field sites or TEM cells (for testing antennas G01R29/105)}
- G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12)
- G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q)

## Abstract

A multi-view planar near-field scattering tomography system is provided herein. In one aspect the system is developed based on the reformulated signal subspace approach. Utilized for solving the electromagnetic inverse scattering problem, the signal subspace approach is reformulated. The present invention pertains to a computationally efficient approach to an electromagnetic inverse scattering-based permittivity profile estimation technique. In a second aspect, the system is developed at the millimeter-wave and THz frequency range to ensure accuracy by eliminating the multipath effects and without the need for an Anechoic chamber or water as a background medium for clinical, security, and manufacturing applications.

## Claims

### Claim 1

A method of estimating the permittivity profile using data collected at observation points comprising the steps of:
(a) measuring incident electric fields over the observation points in the absence of any scatterers;
(b) illuminating a scatterer from different angles;
(c) measuring total electric fields at the observation points for different angles in the presence of the scatterer for a full revolution;
(d) calculating a radiating volume equivalent current source (VECS), a radiating total internal electric field, and a radiating contrast factor of the scatterer for each incident angle;
(e) determining an expected contrast factor and localizing boundaries of the scatterer;
(f) estimating the permittivity profile of OUT; and
(g) determining the conductivity profile of OUT utilizing the following equation:
κ
r
=
ϵ
r
-
1
-
j
⁢
σ
ω
⁢
⁢
ϵ
0
,
ϵr, ϵ0, ω, and σ are relative permittivity, free space permittivity, angular frequency, and conductivity respectively.

### Claim 2

A method comprising:
irradiating an object under test (OUT) from multi-views to minimize noise and multipath effects, and enhance image reconstruction,
using a bistatic mm-wave non-linear imaging system for reconstructing tomographic images and estimating conductivity and permittivity profiles by performing the following steps,
(a) measuring incident electric fields over an observation plane in the absence of any scatterers;
(b) illuminating a scatterer from different angles;
(c) measuring total electric fields at the observation plane for different angles in the presence of the scatterer for a full revolution;
(d) calculating a radiating volume equivalent current source (VECS), a radiating total internal electric field, and a radiating contrast factor of the scatterer for each incident angle;
(e) determining an expected contrast factor and localizing boundaries of the scatterer;
(f) estimating the permittivity map of the OUT; and
(g) determining the conductivity map of the OUT utilizing the following equation:
κ
r
=
ϵ
r
-
1
-
j
⁢
σ
ωϵ
0
,
ϵr, ϵ0, ω, and σ are relative permittivity, free space permittivity, angular frequency, and conductivity respectively.