# US 10,768,211 B2 · System and method for current sense resistor compensation

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- Number: US 10,768,211 B2
- Document ID: US10768211B2
- Status: Granted
- Kind: B2
- Application number: 15/962,955
- Filed: 2018-04-25
- Published: 2019-02-28
- Granted: 2020-09-08
- Earliest claimed: 2017-08-25
- Assignees: Oracle International Corporation
- Applicants: Oracle International Corporation
- Inventors: Peter J. Pupalaikis; Lawrence W. Jacobs; Istvan Novak
- Web page: https://patentgrep.com/patent/US10768211B2

## CPC

- G01R 19/2509: {Details concerning sampling, digitizing or waveform capturing}
- G01R 19/2516: {Modular arrangements for computer based systems; using personal computers (PC's), e.g. "virtual instruments"}
- G01R 31/40: Testing power supplies (testing photovoltaic devices H02S50/10)
- G01R 15/005: {Circuits for altering the indicating characteristic, e.g. making it non-linear}
- G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12)

## Abstract

Systems and methods are provided for compensating for parasitics in current measurements utilizing series current sense resistors. In one or more embodiments, the techniques include connecting a probe to a terminal of a circuit and a waveform measuring device. A waveform measuring device then acquires, through the probe, a voltage waveform. A virtual probe netlist is generated, where the netlist is descriptive of a series resistance and associated parasitics. A virtual probe processor converts, based on the virtual probe netlist, the voltage waveform to a current waveform representative of a current in the circuit.

## Claims

### Claim 1

A method for generating a current waveform, the method comprising:
connecting a probe to a terminal of a circuit and a waveform measuring device;
acquiring, by the waveform measuring device through the probe, a voltage waveform;
generating a virtual probe netlist descriptive of a series resistance and associated parasitics;
converting, by a virtual probe processor based on the virtual probe netlist, the voltage waveform to the current waveform, wherein the current waveform is representative of a current in the circuit.

### Claim 2 (depends on 1)

The method of claim 1, wherein the associated parasitics includes a parasitic inductance and wherein the virtual probe processor compensates for the parasitic inductance based on the virtual probe netlist to generate the current waveform.

### Claim 3 (depends on 2)

The method of claim 2, further comprising tuning a value representing the parasitic inductance in the virtual probe netlist until unexpected characteristics associated with the parasitic inductance are substantially removed.

### Claim 4 (depends on 3)

The method of claim 3, wherein the unexpected characteristics include Fourier series components of the current waveform.

### Claim 5 (depends on 3)

The method of claim 3, wherein the unexpected characteristics include time-domain discontinuities.

### Claim 6 (depends on 1)

The method of claim 1, wherein the associated parasitics includes a parasitic capacitance and wherein the virtual probe processor compensates for the parasitic capacitance based on the virtual probe netlist to generate the current waveform.

### Claim 7 (depends on 1)

The method of claim 1, wherein the circuit is a power converter, the method further comprising tuning a value representing at least one parasitic in the virtual probe netlist until unexpected characteristics associated with a power converter are substantially removed.

### Claim 8 (depends on 1)

The method of claim 1, further comprising receiving, through a user interface, an adjustment to at least one value approximating the associated parasitics; and in response to receiving, through the user interface, the adjustment to the at least one value, updating the virtual probe netlist and the current waveform.

### Claim 9 (depends on 1)

The method of claim 1, wherein converting the voltage waveform comprises applying a filter that is generated as a function of the virtual probe netlist.

### Claim 10

A system for generating a current waveform, the system comprising:
a probe that is connected to a terminal of a circuit;
a waveform measuring device connected to the probe that acquires, through the probe, a voltage waveform;
a virtual probe processor that receives a virtual probe netlist descriptive of a series resistance and associated parasitics;
wherein the virtual probe processor converts, based on the virtual probe netlist, the voltage waveform to the current waveform;
wherein the current waveform is representative of a current in the circuit.

### Claim 11 (depends on 10)

The system of claim 10, wherein the associated parasitics includes a parasitic inductance and wherein the virtual probe processor compensates for the parasitic inductance based on the virtual probe netlist to generate the current waveform.

### Claim 12 (depends on 11)

The system of claim 11, wherein the virtual probe processor further tunes a value representing the parasitic inductance in the virtual probe netlist until unexpected characteristics associated with the parasitic inductance are substantially removed.

### Claim 13 (depends on 12)

The system of claim 12, wherein the unexpected characteristics include Fourier series components of the current waveform.

### Claim 14 (depends on 12)

The system of claim 12, wherein the unexpected characteristics include time-domain discontinuities.

### Claim 15 (depends on 10)

The system of claim 10, wherein the associated parasitics includes a parasitic capacitance and wherein the virtual probe processor compensates for the parasitic capacitance based on the virtual probe netlist to generate the current waveform.

### Claim 16 (depends on 10)

The system of claim 10, wherein the circuit is a power converter, wherein the virtual probe processor further tunes a value representing at least one parasitic in the virtual probe netlist until unexpected characteristics associated with a power converter are substantially removed.

### Claim 17 (depends on 10)

The system of claim 10, further comprising a user interface for adjusting at least one value approximating the associated parasitics; wherein in response to receiving, through the user interface, an adjustment to the at least one value, the virtual probe processor updates the current waveform.

### Claim 18 (depends on 10)

The system of claim 10, wherein virtual probe process converts the voltage waveform by applying a filter that is generated as a function of the virtual probe netlist.

### Claim 19

An apparatus for generating a current waveform, the apparatus comprising:
a probe input that includes or connects to a probe for connecting to a terminal of a circuit;
a waveform processor connected to the probe input that acquires, through the probe, a voltage waveform; and
a virtual probe processor that receive a virtual probe netlist descriptive of a series resistance and associated parasitics and converts, based on the virtual probe netlist, the voltage waveform to a current waveform representative of current in the circuit.

### Claim 20 (depends on 19)

The apparatus of claim 19, further comprising a know or a dial that tunes a value representing the associated parasitics when turned causing the virtual probe processor to update the current waveform representative of the current in the circuit.
