# US 10,768,207 B2 · Electrical connection device

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- Number: US 10,768,207 B2
- Document ID: US10768207B2
- Status: Granted
- Kind: B2
- Application number: 16/604,546
- Filed: 2018-04-03
- Published: 2020-04-23
- Granted: 2020-09-08
- Earliest claimed: 2017-04-21
- Assignees: Kabushiki Kaisha Nihon Micronics
- Applicants: Kabushiki Kaisha Nihon Micronics
- Inventors: Takayuki Hayashizaki
- Web page: https://patentgrep.com/patent/US10768207B2

## CPC

- G01R 1/073: Multiple probes
- G01R 1/07371: {using an intermediate card or back card with apertures through which the probes pass}
- G01R 1/07357: {with flexible bodies, e.g. buckling beams}
- G01R 31/26: Testing of individual semiconductor devices (testing of photovoltaic devices H02S50/10; testing or measuring during manufacture or treatment {H10P74/00})
- G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12)

## Abstract

An electrical connection device includes: a probe head (20) including a guide hole (200), in which a shape perpendicular to an extending direction of the guide hole (200) is a shape formed by round-chamfering corner portions of a polygonal shape; and a probe (10) held by the probe head (20) in a state of penetrating the guide hole (200), wherein notches which go along an axial direction of the probe (10) are formed on angle regions of the probe (10), the angle regions facing the corner portions (200C) of the guide hole (200).

## Claims

### Claim 1

An electrical connection device comprising:
a probe head including a guide hole, in which a shape perpendicular to an extending direction of the guide hole is a shape formed by round-chamfering corner portions of a polygonal shape; and
a probe held by the probe head in a state of penetrating the guide hole,
wherein notches which go along an axial direction of the probe are formed on angle regions of the probe, the angle regions facing the corner portions of the guide hole.

### Claim 2 (depends on 1)

The electrical connection device according to claim 1, wherein the notches have a shape in which the angle regions are cut into a quadrangular shape on a cross section perpendicular to the axial direction.

### Claim 3 (depends on 1)

The electrical connection device according to claim 1, wherein the notches have a shape in which the angle regions are cut into a stair shape on a cross section perpendicular to the axial direction.

### Claim 4 (depends on 1)

The electrical connection device according to claim 1, wherein the notches are formed by chamfering the angle regions of the probe.

### Claim 5 (depends on 1)

The electrical connection device according to claim 1, wherein the shape perpendicular to the extending direction of the guide hole is a shape having four pieces of the corner portions and approximate to a quadrangular shape.

### Claim 6 (depends on 1)

The electrical connection device according to claim 1, wherein the probe is held inside the probe head in a state of being curved by elastic deformation.

### Claim 7 (depends on 1)

The electric connection device according to claim 1,
wherein the probe head includes a top portion, an upper guide portion, a lower guide portion, and a bottom portion,
each of the top portion, the upper guide portion, the lower guide portion and the bottom portion has the guide hole that allows penetration of the probe, and
the notches are formed on at least the angle regions of the probe, the angle regions facing the corner portions of the guide hole.