# US 10,768,118 B2 · Surface defect inspection device and method > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 10,768,118 B2 - Document ID: US10768118B2 - Status: Granted - Kind: B2 - Application number: 16/616,011 - Filed: 2018-04-06 - Published: 2020-03-19 - Granted: 2020-09-08 - Earliest claimed: 2017-05-29 - Assignees: Konica Minolta, Inc. - Applicants: Konica Minolta, Inc. - Inventors: Koji Harada; Masato Kashihara; Taizo Wakimura - Web page: https://patentgrep.com/patent/US10768118B2 ## CPC - G01B 11/303: {using photoelectric detection means} - G01N 21/8851: {Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges (G01N21/8806 and G01N21/93 - G01N21/95692 take precedence; optical measurement of dimensions G01B11/00; optical scanning G02B26/10; image transformation G06T3/00; computerised image enhancement G06T5/00; image processing per se for flaw detection G06T7/0002)} - G01B 11/30: for measuring roughness or irregularity of surfaces - G06T 7/0004: {Industrial image inspection} - G01N 2021/8829: {Shadow projection or structured background, e.g. for deflectometry} - G01N 2021/8887: {based on image processing techniques} - G06T 2207/10152: Varying illumination - G06T 2207/30156: Vehicle coating - G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS - G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q) - G06T: IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ## Abstract According to a surface defect inspection device and a surface defect inspection method according to the present invention, an inspection face of an inspection object is irradiated with illumination light, and a defect at the inspection face is detected, based on an image including the inspection face captured. According to the surface defect inspection device and the surface defect inspection method, the illumination light is emitted with formation of at least one set of a light region and a dark region, and a range of a defect detection image region for the detection of the defect, to be set to the image capturing the inspection face irradiated with the illumination light in the light region, is adjusted in accordance with a previously defined degree of visibility for orange peel, at the detection of the defect at the inspection face. ## Claims ### Claim 1 A surface defect inspection device that irradiates an inspection face of an inspection object with illumination light, and detects a defect at the inspection face, based on an image including the inspection face captured, the surface defect inspection device comprising: an image capturing unit configured to capture an image; an illuminator that forms at least one set of a light region and a dark region, and emits the illumination light with the formation; a region adjuster that adjusts a range of a defect detection image region for the detection of the defect, to be set to the image capturing the inspection face irradiated with the illumination light in the light region, in accordance with a previously defined degree of visibility for orange peel, at the detection of the defect at the inspection face; a correspondence relationship information storage storing, as correspondence relationship information, an adjustment value for the adjustment of the range of the defect detection image region, in association with the degree of visibility for orange peel; and an inputter that receives input of the degree of visibility for orange peel, wherein the region adjuster determines the adjustment value corresponding to the degree of visibility for orange peel received by the inputter, from the correspondence relationship information stored in the correspondence relationship information storage, and adjusts the range of the defect detection image region with the determined adjustment value. ### Claim 2 (depends on 1) The surface defect inspection device according to claim 1, wherein the correspondence relationship information storage unit stores, as the correspondence relationship information, the adjustment value further in association with a type of the inspection object, the inputter further receives input of the type of the inspection object, and the region adjuster determines the adjustment value corresponding to the degree of visibility for orange peel and the type of the inspection object received by the inputter, from the correspondence relationship information stored in the correspondence relationship information storage, and adjusts the range of the defect detection image region with the determined adjustment value. ### Claim 3 (depends on 2) The surface defect inspection device according to claim 2, wherein the inspection object is an exteriorly painted vehicle, and the type of the inspection object is classified with a part of the vehicle. ### Claim 4 (depends on 3) The surface defect inspection device according to claim 3, further comprising: a second inputter that receives input of a range of the light region; and a controller that controls the illuminator such that the range of the light region received by the second inputter is achieved. ### Claim 5 (depends on 2) The surface defect inspection device according to claim 2, further comprising: a second inputter that receives input of a range of the light region; and a controller that controls the illuminator such that the range of the light region received by the second inputter is achieved. ### Claim 6 (depends on 1) The surface defect inspection device according to claim 1, further comprising: a second inputter that receives input of a range of the light region; and a controller that controls the illuminator such that the range of the light region received by the second inputter is achieved. ### Claim 7 (depends on 1) The surface defect inspection device according to claim 1, further comprising: a second inputter that receives input of a range of the light region; and a controller that controls the illuminator such that the range of the light region received by the second inputter is achieved. ### Claim 8 (depends on 1) The surface defect inspection device according to claim 1, wherein the correspondence relationship information storage unit stores a plurality of adjustment values in association with the degree of visibility for orange peel, and the inputter selects one in association with the degree of visibility for orange peel among a plurality of options. ### Claim 9 A surface defect inspection method including irradiating an inspection face of an inspection object with illumination light, and detecting a defect at the inspection face, based on an image including the inspection face captured, the surface defect inspection method comprising: capturing an image; emitting the illumination light with formation of at least one set of a light region and a dark region; adjusting a range of a defect detection image region for the detection of the defect, to be set to the image capturing the inspection face irradiated with the illumination light in the light region, in accordance with a previously defined degree of visibility for orange peel, at the detection of the defect at the inspection face; storing correspondence relationship information, as correspondence relationship information in a correspondence relationship information storage, an adjustment value for the adjustment of the range of the defect detection image region, in association with the degree of visibility for orange peel; and receiving, by an inputter, input of the degree of visibility for orange peel, wherein the region adjuster determines the adjustment value corresponding to the degree of visibility for orange peel received by the inputter, from the correspondence relationship information stored in the correspondence relationship information storage, and adjusts the range of the defect detection image region with the determined adjustment value. ### Claim 10 (depends on 9) The surface defect inspection method according to claim 9, wherein the correspondence relationship information storage stores a plurality of adjustment values in association with the degree of visibility for orange peel, and the inputter selects one in association with the degree of visibility for orange peel among a plurality of options.