US 10,763,880 B1Granted

Analog to digital converter

AssigneeNXP USA, Inc.

InventorsChristopher James Micielli, Srikanth Jagannathan, George Rogers Kunnen

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Abstract

An A/D converter includes multiple bin comparators that compare an analog voltage to corresponding bin threshold voltages to provide output signals for providing corresponding comparison results. Some of the comparators includes enable inputs that selectively enable the output signal of the bin comparator to provide the corresponding comparison result based on a corresponding comparison result from at least one other bin comparator. The A/D convertor includes an encoder that utilizes the output signals to provide encoded bit values of the digital output. The A/D converter includes a bin selection circuit that utilizes the output signals to select a voltage level based on the output signals and provides the selected voltage level to a next stage of the A/D convertor. The next stage uses the selected voltage level and the analog voltage to provide at least one lessor bit of the digital output.

Claims20

Dependent claims

An analog-to-digital converter (A/DC) configured to receive an analog voltage and provide a digital output which corresponds to a digital representation of the analog voltage, the A/DC comprising:

N bin comparators, wherein N is an integer greater than one, wherein each bin comparator of the N bin comparators is coupled to receive the analog voltage and a corresponding bin threshold voltage and configured to provide an output signal for providing a corresponding comparison result between the analog voltage and the corresponding bin threshold voltage such that the N bin comparators provide N output signals, and wherein each bin comparator of N−1 bin comparators of the N bin comparators includes:
an enable input configured to selectively enable the output signal of the bin comparator to provide the corresponding comparison result based on a corresponding comparison result from at least one other bin comparator of the N bin comparators;
an encoder circuit coupled to receive the N output signals from the N bin comparators and configured to encode the N output signals to form at least one more significant bit of the digital output;
and
a bin selection circuit configured to select a voltage level based on the N output signals and provide the selected voltage level to a next stage of the A/DC, wherein the next stage of the A/DC is configured to use the selected voltage level and the analog voltage to provide at least one less significant bit of the digital output wherein the at least one less significant bit is less significant than the at least one more significant bit.

2 more elements

An analog-to-digital (A/DC) converter configured to receive an analog voltage and provide a digital output which corresponds to a digital representation of the analog voltage, the A/DC comprising:

a first bin comparator coupled to receive the analog voltage and a first bin threshold voltage and configured to provide a first output signal for providing a first comparison result between the analog voltage and the first bin threshold voltage;
a second bin comparator coupled to receive the analog voltage and a second bin threshold voltage and configured to provide a second output signal for providing a second comparison result between the analog voltage and the second bin threshold voltage, wherein the second output signal is configured to be selectively enabled to provide the second comparison result based at least on the first output signal;
a third bin comparator coupled to receive the analog voltage and a third bin threshold voltage and configured to provide a third output signal for providing a third comparison result between the analog voltage and the third bin threshold voltage, wherein the third output signal is configured to be selectively enabled to provide the third comparison result based on at least on the second output signal and the first output signal;
an encoder circuit coupled to receive the first, second, and third output signals and configured to use the first, second, and third output signals to form at least one more significant bit of the digital output;
and
a bin selection circuit configured to select a voltage level based on the first, second, and third output signals and provide the selected voltage level to a next stage of the A/DC, wherein the next stage of the A/DC is configured to use the selected voltage level and the analog voltage to provide at least one lesser significant bit of the digital output, the at least one lessor significant bit is of less significance than the at least on more significant bit.

3 more elements

Dependencies are inferred from the claim text.

Facts

Application: 16/275,647Filed 14 Feb 2019
Published: US 2020/0266825 A120 Aug 2020
Granted: 1 Sep 2020
Term ends: Not estimatedThe source records don’t support an estimate.

Classification5 codes

H03M 1/361
Simultaneously only, i.e. parallel type: having a separate comparator and reference value for each quantisation level, i.e. full flash converter type
H03M 1/365
The reference values being generated by a resistive voltage divider: the voltage divider being a single resistor string
H03M 1/145
Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit: the steps being performed…
H03M 1/164
With scale factor modification, i.e. by changing the amplification between the steps: the steps being performed sequentially in series-connected…