Method for stabilizing spin element and method for manufacturing spin element
AssigneeTDK Corporation
InventorsYohei Shiokawa, Tomoyuki Sasaki
Life of this patent
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Abstract
In the method for stabilizing a spin element according to an aspect of the disclosure, the spin element includes a current-carrying part extending in a first direction, and an element part laminated on one surface of the current-carrying part and including a ferromagnetic material, in the case where the environmental temperature is a predetermined temperature, a pulse current having a current density of 1.0×107 A/cm2 or more and 1.0×109 A/cm2 or less and a pulse width within a predetermined range is applied at least a predetermined number of times in the first direction of the current-carrying part at intervals of a predetermined waiting time.
Claims13
A method for stabilizing a spin element, the spin element including:
- a current-carrying part extending in a first direction;
- and an element part laminated on one surface of the current-carrying part and including a ferromagnetic material,
- the method comprising:
- applying a pulse current having a current density of 1.0×107 A/cm2 or more and 1.0×109 A/cm2 or less in the first direction of the current-carrying part,
- wherein in the case where an environmental temperature is 20° C. or higher and lower than 50° C., a pulse width of the pulse current is 1 nsec or more and 100 nsec or less, and the pulse current is applied 108 times or more at intervals of a waiting time 10 or more times longer than the pulse width of the pulse current to be applied,
- in the case where an environmental temperature is 50° C. or higher and 200° C. or lower, a pulse width of the pulse current is 1 nsec or more and 100 nsec or less, and the pulse current is applied 107 times or more at intervals of a waiting time 10 or more times longer than the pulse width of the pulse current to be applied, and
- in the case where an environmental temperature is −100° C. or higher and lower than 20° C., a pulse width of the pulse current is 10 nsec or more and 1 μsec or less, and the pulse current is applied 107 times or more at intervals of a waiting time equal to or longer than the pulse width of the pulse current to be applied.
Dependencies are inferred from the claim text.