Analyzing apparatus
AssigneeShimadzu Corporation
InventorsShinichi Yamaguchi, Yoshikatsu Umemura, Masahiro Ikegami, Koji Tanaka
Life of this patent
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AssigneeShimadzu Corporation
InventorsShinichi Yamaguchi, Yoshikatsu Umemura, Masahiro Ikegami, Koji Tanaka
Estimating the term…
For every acquisition of a set of mass spectrum data, a mass calibrator (determines the amount of mass discrepancy using the appearance position of a peak originating from an internal standard substance having a known m/z value, and performs a process for correcting the mass discrepancy. A mass calibration information collector (collects the amount of mass discrepancy or mass correction quantity for each set of mass spectrum data. After the completion of the measurement, a three-dimensional display information creator creates a three-dimensional graph showing the large number of collected mass correction quantities plotted in a three-dimensional space in which the retention time in a primary column and the retention time in a secondary column in a comprehensive two-dimensional LC unit are represented by two mutually orthogonal axes while the mass correction quantity is represented by the axis orthogonal to those two axes.
An analyzing device configured to obtain, for one sample, signal intensity values as analysis data by performing an analysis on each of micro areas on an N-dimensional space which is either a virtual space or a real space (where N is an integer equal to or greater than two), comprising:
An analyzing device configured to obtain, for a sample, signal intensity values as data by performing an analysis on each of micro areas on an N-dimensional space which is either a virtual space or a real space (where N is an integer equal to or greater than two), comprising:
Dependencies are inferred from the claim text.