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US 10,763,093 B2Granted
Mass analysis apparatus and mass analysis method
AssigneeJEOL Ltd.
InventorJunkei Kou
Life of this patent
Estimating the term…
Abstract
Neutral particles are blocked by a deflector provided upstream of a detector. A controller changes a reference potential V2 of the deflector in connection with a change of a reference potential V1 of a collision cell such that a potential difference ΔV between the reference potential V1 and the reference potential V2 is constant. The change of the reference potential V2 is executed during a period in which an ion pulse does not pass the deflector.
Claims13
A mass analysis apparatus comprising:
- a collision cell that generates product ions from precursor ions;
- a detector that detects target ions selected from among the product ions;
- a deflector that is provided between the collision cell and the detector and that applies a deflection action on the target ions;
- and
- a controller that changes a reference potential of the deflector in connection with a change of a reference potential of the collision cell such that a potential difference between the reference potential of the collision cell and the reference potential of the deflector is constant.
2 more elements
A mass analysis method comprising:
- generating product ions from precursor ions in a collision cell;
- detecting target ions selected from among the product ions in a detector;
- applying a deflection action on the target ions in a deflector provided between the collision cell and the detector;
- and
- changing a reference potential of the deflector in connection with a change of a reference potential of the collision cell such that a potential difference between the reference potential of the collision cell and the reference potential of the deflector is constant.
2 more elements
A mass analysis apparatus comprising:
- an ion source that generates ions;
- a collision cell that generates product ions from precursor ions selected from among the ions generated by the ion source;
- a detector that detects target ions selected from among the product ions;
- a deflector that is provided between the collision cell and the detector and that applies a deflection action on the target ions, wherein the deflector and the detector are positioned to a side of the collision cell opposite the ion source;
- and
- a controller that changes a reference potential of the deflector in connection with a change of a reference potential of the collision cell,
- wherein the controller changes the reference potential of the deflector in connection with the change of the reference potential of the collision cell such that a deflection angle of the target ions in the deflector is constant regardless of the change of the reference potential of the collision cell.
4 more elements
Dependencies are inferred from the claim text.