Charged particle beam apparatus and image acquisition method
AssigneeJEOL Ltd.
InventorTakeshi Otsuka
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AssigneeJEOL Ltd.
InventorTakeshi Otsuka
Estimating the term…
A charged particle beam apparatus acquires a scanned image by scanning a sample with a charged particle beam and detecting charged particles emitted from the sample. The charged particle beam apparatus includes: a plurality of detection units that detect charged particles emitted from the sample; and an image processing unit that generates the scanned image based on a plurality of detection signals outputted from the plurality of the detection units. The image processing unit performs a process of calculating a tilt direction of a sample surface and a tilt angle of the sample surface based on the plurality of the detection signals for an irradiation position of the charged particle beam; and a process of determining a color of a pixel of the scanned image according to the calculated tilt direction and the calculated tilt angle.
A charged particle beam apparatus that acquires a scanned image by scanning a sample with a charged particle beam and detecting charged particles emitted from the sample, the charged particle beam apparatus comprising:
An image acquisition method used by a charged particle beam apparatus that acquires a scanned image by scanning a sample with a charged particle beam and detecting charged particles emitted from the sample with a plurality of detection units, the image acquisition method comprising:
Dependencies are inferred from the claim text.