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US 10,762,978 B2Granted
Post-packaging environment recovery of graphics on-die memory
AssigneeIntel Corporation
InventorsAltug Koker, Travis T. Schluessler, Ankur N. Shah, Abhishek R. Appu, Joydeep Ray, Jonathan Kennedy
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Abstract
Systems, apparatuses and methods may provide for technology that identifies a redundant portion of a packaged on-die memory and detects, during a field test of the packaged on-die memory, one or more failed cells in the packaged on-die memory. Additionally, one or more memory cells in the redundant portion may be substituted for the one or more failed memory cells.
Claims20
A system comprising:
- a display;
- a power supply to provide power to the system;
- and
- a semiconductor package apparatus including a substrate, an on-die memory coupled to the substrate, the on-die memory including a redundant portion, and logic coupled to the substrate, wherein the logic is implemented in one or more of configurable logic or fixed-functionality hardware logic, the logic coupled to the substrate to:
- identify the redundant portion of the on-die memory,
- adjust a periodic timer in accordance with a likelihood of failure of the on-die memory,
- periodically adapt the periodic timer over time in accordance with the likelihood of failure increasing over time,
- execute a field test on the on-die memory in response to one or more of an expiration of the periodic timer, each power down condition associated with the on-die memory, each power up condition associated with the on-die memory or an idleness condition associated with the on-die memory,
- detect, during the field test of the on-die memory, one or more failed memory cells in the on-die memory, and
- substitute one or more remaining memory cells in the redundant portion for the one or more failed memory cells.
7 more elements
An apparatus comprising:
- a substrate;
- an on-die memory coupled to the substrate, the on-die memory including a redundant portion;
- and
- logic coupled to the substrate, wherein the logic is implemented in one or more of configurable logic or fixed-functionality hardware logic, the logic coupled to the substrate to:
- identify the redundant portion of the on-die memory,
- adjust a periodic timer in accordance with a likelihood of failure of the on-die memory,
- periodically adapt the periodic timer over time in accordance with the likelihood of failure increasing over time,
- execute a field test on the on-die memory in response to one or more of an expiration of the periodic timer, each power down condition associated with the on-die memory, each power up condition associated with the on-die memory or an idleness condition associated with the on-die memory,
- detect, during the field test of the on-die memory, one or more failed memory cells in the on-die memory, and
- substitute one or more remaining memory cells in the redundant portion for the one or more failed memory cells.
7 more elements
A method comprising:
- identifying a redundant portion of a packaged on-die memory;
- adjusting a periodic timer in accordance with a likelihood of failure of the on-die memory;
- periodically adapting the periodic timer over time in accordance with the likelihood of failure increasing over time;
- executing a field test on the on-die memory in response to one or more of an expiration of the periodic timer, each power down condition associated with the on-die memory, each power up condition associated with the on-die memory or an idleness condition associated with the on-die memory;
- detecting, during the field test of the on-die memory, one or more failed memory cells in the on-die memory;
- and
- substituting one or more remaining memory cells in the redundant portion for the one or more failed memory cells.
4 more elements
At least one non-transitory computer readable storage medium comprising a set of instructions, which when executed by a computing system, cause the computing system to:
- identify a redundant portion of a packaged on-die memory;
- adjust a periodic timer in accordance with a likelihood of failure of the on-die memory;
- periodically adapt the periodic timer over time in accordance with the likelihood of failure increasing over time;
- execute a field test on the on-die memory in response to one or more of an expiration of the periodic timer, each power down condition associated with the on-die memory, each power up condition associated with the on-die memory or an idleness condition associated with the on-die memory;
- detect, during the field test of the on-die memory, one or more failed memory cells in the on-die memory;
- and
- substitute one or more remaining memory cells in the redundant portion for the one or more failed memory cells.
4 more elements
Dependencies are inferred from the claim text.