Resistive memory device including a reference cell and method of controlling a reference cell to identify values stored in memory cells
AssigneeSamsung Electronics Co., Ltd.
InventorsSuk-soo Pyo, Hyun-taek Jung, So-hee Hwang, Tae-joong Song
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Abstract
A method of controlling a reference cell in a resistive memory to identify values stored in a plurality of memory cells is provided. The method includes writing a first value to the plurality of memory cells, providing, to the reference cell, monotonically increasing or monotonically decreasing reference currents. The method includes reading the plurality of memory cells as each of the reference currents is provided to the reference cell, and determining a read reference current based on an aggregation of results of the reading.
Claims17
A method of controlling a reference cell in a resistive memory to identify values stored in a plurality of memory cells, the method comprising:
- writing a first value to the plurality of memory cells;
- providing, to the reference cell, reference currents that either only monotonically increase or only monotonically decrease, wherein the reference cell is a shorted cell;
- reading repeatedly the plurality of memory cells written as the first value while the reference currents monotonically increase or decrease;
- and
- determining a read reference current based on results of the repeated reading.
A method of controlling a reference cell in a resistive memory to identify values stored in a plurality of memory cells, the method comprising:
- writing a first value to the plurality of memory cells;
- setting monotonically increasing or monotonically decreasing resistances of a reference resistor through which a reference current passes, wherein the reference current also passes through the reference cell, and wherein the reference cell is a shorted cell;
- reading repeatedly the plurality of memory cells written as the first value, while the resistances of the reference resistor monotonically increase or decrease;
- and
- determining a read reference resistance, based on an aggregation of results of the repeated reading by estimating a first distribution of resistances corresponding to the first value stored in the memory cells based on the results of the repeated reading.
A resistive memory device configured to receive a reference adjustment signal, the resistive memory device comprising:
- a cell array comprising memory cells and a reference cell, wherein the memory cells are connected to respective first source lines and respective first bit lines, and wherein the reference cell is connected to a second source line and a second bit line;
- a current source circuit configured to provide, in response to a read command, a read current and a variable reference current respectively to the memory cells and the reference cell via the first source lines or the second source line;
- an amplification circuit configured to detect voltages between the first source lines connected to the memory cells and the second source line connected to the reference cell;
- and
- a control circuit configured to control the current source circuit such that the reference current is adjusted regardless of the read current, in response to the reference adjustment signal,
- wherein the reference cell comprises:
- a transistor connected to the second source line and the second bit line and having a gate connected to a word line that is connected to at least one of the memory cells,
- wherein the transistor is configured to electrically connect the second source line and the second bit line in response to the word line being activated, and
- wherein a memory cell of the memory cells comprises a magnetic tunnel junction (MTJ) element and a transistor serially connected between a corresponding third source line of the first source lines and a corresponding third bit line of the first bit lines connected to the memory cell, and
- wherein the transistor comprises a gate connected to a same word line as the reference cell.
Dependencies are inferred from the claim text.