Method to enhance the resolution of maskless lithography while maintaining a high image contrast
AssigneeApplied Materials, Inc.
InventorsChristopher Dennis Bencher, Joseph R. Johnson
Life of this patent
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AssigneeApplied Materials, Inc.
InventorsChristopher Dennis Bencher, Joseph R. Johnson
Estimating the term…
The embodiments described herein relate to a software application platform, which enhances image patterns resolution on a substrate. The application platform method includes running an algorithm to provide different target polygons for forming a pattern on a target. A minimum feature size which may be formed by a DMD is determined. For each target polygons smaller than the minimum feature size determining to line bias or shot bias the one or more target polygons to achieve an acceptable exposure contrast at the target polygon boundary. The one or more target polygons smaller than the minimum feature size are biased to form a digitized pattern on the substrate. Electromagnetic radiation is delivered to reflect off of a first mirror of the DMD when the centroid for the first mirror is within the one or more target polygons.
A method to enhance the resolution of maskless lithography while maintaining a high image contrast on a substrate, comprising:
A computer system for enhancing the resolution of maskless lithography while maintaining a high image contrast on a substrate, comprising:
A non-transitory computer-readable medium storing instructions that, when executed by a processor, cause a computer system to enhance the resolution of maskless lithography while maintaining a high image contrast on a substrate, by performing the steps of:
Dependencies are inferred from the claim text.