Method for evaluating positioning parameters and system
AssigneeOSRAM GmbH
InventorsMichael Eschey, Helmi Abidi
Life of this patent
Estimating the term…
Loading patent…
AssigneeOSRAM GmbH
InventorsMichael Eschey, Helmi Abidi
Estimating the term…
A method for evaluating positioning parameters in a defined area, wherein the defined area is affected by at least three stationary access beam points and over which a grid pattern is laid with at least two grids, each grid having an anchor. An initial vector of positioning parameters is assigned to each anchor and a plurality of RSSI measurements are captured within the defined area by receiving signals from the at least three stationary access beam points. The plurality of RSSI measurement are clustered in a plurality of subsets, wherein the number of subsets corresponds to the number of the at least two grids. Finally, each subset of the plurality of subsets is associated with a respective one of the at least two grids and the initial vector is updated based on the subset of the plurality of subsets associated with the respective one of the at least two grids.
Method for evaluating positioning parameters in a defined space, particularly in an indoor space, wherein the defined space is affected by at least three stationary access beam points and over which a grid pattern is laid with at least two grids, each grid having an anchor, the method characterized by the steps of:
A non-transitory computer readable medium that contains instructions that when executed in a computer having a memory and one or more processors causes the one or more processors to:
System for evaluating positioning parameters in a defined space, particularly in an indoor space, wherein the defined space is affected by at least three stationary access beam points and over which a grid pattern is laid with at least two grids, each grid having an anchor, and wherein the system comprises
Dependencies are inferred from the claim text.