Illuminating fixture and device
AssigneeWuhan China Star Optoelectronics Semiconductor Display Technology Co., Ltd.
InventorQianwen Xu
Life of this patent
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Abstract
An illuminating fixture and a device are provided. The illuminating fixture includes an intelligence control system, a scanning system, wires, and at least two sets of probes. One end of the probe is connected with a probe arm, and the probe arm is configured to control a slide movement of the probe along an up and down direction and rotation of the probe. the scanning system positions a measurement position of a test element group, and the intelligence control system is configured to automatically adjust a position of the probe by the probe arm according to the measurement position positioned by the scanning system.
Claims10
An illuminating fixture, comprising a sample placement area, at least two luminescent point control switches, an intelligence control system, a scanning system, a printed circuit board, wires, and at least one set of probes,
- wherein one end of the probe is connected with a probe arm, and the probe arm is configured to control a slide movement of the probe along an up and down direction and rotation of the probe;
- the probe has a pressure sensor, the probe arm is configured to control pressure exerted on the probe using the pressure sensor, such that the probes are adaptable to a test element group of different thicknesses;
- wherein the scanning system positions a measurement position of the test element group, and the intelligence control system is configured to automatically adjust a position of the probe by the probe arm according to the measurement position positioned by the scanning system;
- wherein the at least one set of the probes comprises a cathode probe and an anode probe, the probe arm is configured to control the probe and is connected with a transmission device, and wherein the transmission device comprises a lift frame and a mechanical lever;
- and
- wherein the mechanical lever is controlled by an intelligence control system, and a position of the probe arm is controlled by the mechanical lever and the lift frame.
An illuminating fixture device, comprising an illuminating fixture comprising a sample placement area, at least two luminescent point control switches, an intelligence control system, a scanning system, a printed circuit board, a wire, and at least one set of probes,
- wherein one end of the probe is connected with a probe arm, and the probe arm is configured to control a slide movement of the probe along an up and down direction and rotation of the probe;
- wherein the scanning system positions a measurement position of the test element group, and the intelligence control system is configured to automatically adjust a position of the probe by the probe arm according to the measurement position positioned by the scanning system;
- wherein the at least one set of the probes comprises a cathode probe and an anode probe, the probe arm is configured to control the probe and is connected with a transmission device, and wherein the transmission device comprises a lift frame and a mechanical lever;
- and
- wherein the mechanical lever is controlled by an intelligence control system, and a position of the probe arm is controlled by the mechanical lever and the lift frame.
An illuminating fixture, comprising:
- a sample placement area, at least two luminescent point control switches, an intelligence control system, a scanning system, a printed circuit board, a wire, and at least one set of probes,
- wherein one end of the probe is connected with a probe arm which is capable of controlling an up and down slide movement of the probe and rotation of the probe;
- the scanning system positions a measurement position of the test element group, and the intelligence control system is configured to automatically adjust a position of the probe by the probe arm according to the measurement position positioned by the scanning system;
- wherein the at least one set of the probes comprises a cathode probe and an anode probe, the probe arm is configured to control the probe and is connected with a transmission device, and wherein the transmission device comprises a lift frame and a mechanical lever;
- and
- wherein the mechanical lever is controlled by an intelligence control system, and a position of the probe arm is controlled by the mechanical lever and the lift frame.
Dependencies are inferred from the claim text.