Method for producing a semiconductor device by means of computer-aided development of test scenarios

A system for testing a semiconductor device, comprising:

• a virtual device under test (DUT) implemented as a behavior model of the semiconductor device,
• the behavior model being executed on at least one processor;
• a test development environment, executed on a workstation, for an automatic test equipment (ATE) for programming at least one test;
• and
• a software interface configured to emulate a behavior of the ATE,
• wherein commands are generated by the test development environment,
• wherein first test signals, generated based on the commands, are fed to a real DUT,
• wherein first response signals are obtained from the real DUT based on the first test signals,
• wherein, after the first response signals are obtained, the commands are converted by the software interface into second test signals that are processable by the virtual DUT,
• wherein the second test signals are fed to the virtual DUT, and
• wherein the software interface is further configured to convert second response signals of the virtual DUT into data that is in a format readable by the test development environment and to report the data back to the test development environment.

A non-transitory computer-readable medium storing instructions, the instructions comprising:

• one or more instructions that, when executed by one or more processors, cause the one or more processors to:
• provide a virtual device under test (DUT) implemented as a behavior model of a semiconductor device;
• and
• develop at least one test in a test development environment for an automatic test equipment (ATE),
• wherein commands are generated by the test development environment,
• wherein first test signals, generated based on the commands, are fed to a real DUT,
• wherein first response signals are obtained from the real DUT based on the first test signals,
• wherein, after the first response signals are obtained, the commands are converted, by a software interface that functions as a virtual ATE, into second test signals that are processable by the virtual DUT,
• wherein the second test signals are fed to the virtual DUT, and
• wherein the software interface converts second response signals of the virtual DUT into data that is in a format readable by the test development environment and reports the data back to the test development environment.