Built-in self test for an array of circuit elements

A method comprising:

• selecting a first portion of a main array of circuit elements, the main array of circuit elements representing a main measurement range, and the first portion of the main array of circuit elements representing a partial measurement range;
• testing the first portion of the main array of circuit elements using a test array of circuit elements representing a test measurement range of parameter values, the test array of circuit elements being separate from the main array of circuit elements, the test measurement range being less than the main measurement range, and the partial measurement range being less than or equal to the test measurement range;
• selecting a second portion of the main array of circuit elements representing a second partial measurement range, wherein at least some circuit elements of the second portion are different than the first circuit elements;
• and
• testing the second portion of the main array of circuit elements using the test array of circuit elements.

An analog-to-digital converter (ADC) configured to generate a digital result signal based on an analog input signal, the ADC comprising:

• a sampling array of circuit elements configured to receive the analog input signal and generate a sampled signal;
• a main digital-to-analog conversion (DAC) circuit including a main array of circuit elements representing a main measurement range of parameter values, wherein the main DAC circuit is configured to:
• receive a reference signal and a first control signal;
• and
• generate an approximation signal based on the reference signal and the first control signal;
• comparator circuitry configured to generate a comparison signal based on whether the sampled signal is greater than the approximation signal;
• a test signal generator including a test array of circuit elements representing a test measurement range of parameter values, wherein the main measurement range is greater than the test measurement range, and wherein the test array of circuit elements are separate from the main array of circuit elements;
• and
• digital control circuitry configured to:
• generate a second control signal based on the comparison signal and further based on a conversion algorithm;
• deliver the second control signal to the main DAC circuit;
• generate the digital result signal based on the conversion algorithm;
• select a first start value of a first portion of the main array of circuit elements representing a first partial measurement range, the first partial measurement range being less than or equal to the test measurement range;
• test the first portion of the main array of circuit elements using the test array of circuit elements based on the conversion algorithm;
• select a second start value of a second portion of the main array of circuit elements representing a second partial measurement range, wherein at least some circuit elements of the second portion are different than the first circuit elements;
• test the second portion of the main array of circuit elements using the test array of circuit elements based on the conversion algorithm.