Probe card for a testing apparatus of electronic devices with enhanced filtering properties
AssigneeTechnoprobe S.P.A.
InventorFlavio Maggioni
Life of this patent
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Abstract
A probe card for a testing apparatus of electronic devices comprises at least one testing head housing a plurality of contact probes, each contact probe having at least one contact tip abutting onto contact pads of a device under test, as well as at least one space transformer realizing a spatial transformation of the distances between contact pads made on its opposite sides and connected by means of suitable conductive tracks or planes, as well as a plurality of filtering capacitors provided between the space transformer and a PCB, which comprises direct conductive tracks or planes contacting conductive portions of the filtering capacitors.
Claims26
A probe card for a testing apparatus of electronic devices, comprising:
- a testing head housing a plurality of contact probes having respective contact tips configured to abut onto contact pads of a device under test,
- a space transformer comprising:
- first contact pads made on a first side of the space transformer;
- second contact pads made on a second side, opposite to the first side, of the space transformer;
- and
- conductive tracks or planes connecting at least some of the first contact pads to the second contact pads, the space transformer realizing a spatial transformation of distances between the first contact pads and distances between the second contact pads,
- a printed circuit board (PCB), and
- a first plurality of filtering capacitors positioned between the space transformer and the PCB,
- wherein the PCB comprises direct conductive tracks or planes directly electrically contacting conductive portions of the filtering capacitors, and at least some of the conductive tracks or planes of the space transformer electrically contact the conductive portions of the filtering capacitors, and at least some of the conductive portions of the filter capacitors provide a conductive path from the conductive tracks or planes of the space transformer to the direct conductive tracks or planes of the PCB.
A probe card for a testing apparatus of electronic devices, comprising:
- a testing head housing a plurality of contact probes having respective contact tips configured to abut onto contact pads of a device under test;
- a space transformer comprising:
- first contact pads made on a first side of the space transformer;
- second contact pads made on a second side, opposite to the first side, of the space transformer;
- and
- conductive tracks or planes connecting at least some of the first contact pads to the second contact pads,
- the space transformer realizing a spatial transformation of distances between the first contact pads and distances between the second contact pads,
- a printed circuit board (PCB),
- a first plurality of filtering capacitors positioned between the space transformer and the PCB, wherein the PCB comprises direct conductive tracks or planes electrically contacting conductive portions of the filtering capacitors;
- and
- a conductive flexible interface electrically interconnecting the space transformer and the PCB by pressure.
A probe card for a testing apparatus of electronic devices comprising:
- a testing head housing a plurality of contact probes having respective contact tips configured to abut onto contact pads of a device under test,
- a space transformer comprising:
- first contact pads made on a first side of the space transformer;
- second contact pads made on a second side, opposite to the first side, of the space transformer;
- and
- conductive tracks or planes connecting at least some of the first contact pads to the second contact pads,
- the space transformer realizing a spatial transformation of distances between the first contact pads and distances between the second contact pads,
- a printed circuit board (PCB), and
- a first plurality of filtering capacitors positioned between the space transformer and the PCB, each filtering capacitor comprising a body and conductive portions arranged at sides of the body, the conductive portions electrically contacting the conductive tracks or planes,
- wherein the PCB comprises conductive tracks or planes that directly electrically contact the conductive portions of the filtering capacitors, and at least some of the conductive portions of the filter capacitors provide a conductive path from the conductive tracks or planes of the space transformer to the direct conductive tracks or planes of the PCB.
Dependencies are inferred from the claim text.