Self flattening test socket with anti-bowing and elastomer retention

An apparatus for electrically connecting a lead of an integrated circuit device to be tested (DUT) to a corresponding terminal of a load board at a test site, comprising:

• a. a housing having upper and lower surfaces, a first surface approachable by an integrated circuit device under test (DUT) to be tested and a second surface proximate the load board;
• b. a slot extending through said housing from the first surface to the second surface;
• c. a pin contact receivable in said slot having a first end engagable by the lead and a second tail end in engagement with the terminal, said pin contact being movable between a first orientation unengaged by the lead of the integrated circuit and a second orientation in which said first end of said contact is engaged by the lead of the integrated circuit and urged into said slot;
• d. at least one elastomeric bias element;
• e. said housing including a channel sized to receive a portion of said bias element, said channel extending from said upper surface toward but not up to said lower surface, thereby defining a housing support portion at the bottom of said channel;
• f. said housing including a recess for receiving and engaging a portion of said tail end when said pins is engaged by the DUT, the housing adjacent said recess being deflectable in response to engagement of said tail end;
• so that when said recess is deflected in response to pin movement, contact between the housing and the load board is maintained.

Method of making an integrated circuit testing device which connects terminals on a device under test (DUT) to a corresponding terminal of a load board at a test site, comprising the steps of:

• a. forming a housing having upper and lower surfaces, a first surface approachable by an integrated circuit device under test (DUT) to be tested and a second surface proximate the load board;
• b. forming a slot extending through said housing from the first surface to the second surface;
• c. inserting a pin contact in said slot having a first end engagable by the lead and a second end in engagement with the terminal, said pin contact being movable between a first orientation unengaged by the lead of the integrated circuit and a second orientation in which said first end of said contact is engaged by the lead of the integrated circuit and urged into said slot;
• d. forming at least one elastomeric bias element;
• e. forming an arcuate recess in said pin contact and sizing it generally to receive a portion of said bias element, forming distal terminations at ends of the recess, at least one of said terminations including a projection which narrows the opening of the recess, thereby providing a retainer to maintain the bias element within the recess;
• f. forming a channel in said housing, the channel formed sized to receive a portion of said bias element, said channel extending from said upper surface toward but not up to said lower surface, thereby defining a housing support portion at the bottom of said channel;
• g. forming the channel in an arcuate shape and having a circumference less than half of the circumference of said bias element thereby creating a gap around the bias element;
• wherein, as said pin contact is moved between said first and second orientations thereof, compressing said bias element between said channel and said arcuate recess applying compressive forces on the elastomer but also allowing for shear forces thereon in said gap.