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AssigneeKLA-Tencor Corporation
InventorsQiang Zhang, Abdurrahman Sezginer
Estimating the term…
Disclosed is a system that includes a light source for generating an illumination beam and an illumination lens system for directing the illumination beam towards a sample. The system further includes a collection lens system for directing towards a detector output light from the sample in response to the illumination beam and a detector for receiving the output light from the sample. The collection lens system includes a fixed-design compensator plate having individually selectable filters with different configurations for correcting system aberration of the system under different operating conditions. The system also includes a controller operable for: (i) generating and directing the illumination beam towards the sample, (ii) selecting operating conditions and a filter for correcting the system aberration under such selected operating conditions, (iii) generating an image based on the output light, and (iv) determining whether the sample passes inspection or characterizing such sample based on the image.
An inspection system for detecting defects in a semiconductor sample, the system comprising:
A method of designing and using a compensator in an inspection system for detecting defects in a semiconductor sample, the method comprising:
Dependencies are inferred from the claim text.