Apparatus and method for extracting low intensity photonic signals

A system for detecting a material of interest, comprising:

• a radiation source;
• a plurality of imaging components;
• and
• a display;
• wherein, in use, the system is configured to:
• a) emit probe radiation from the radiation source for a first time period, the radiation having a wavelength suitable for interacting with the material of interest;
• b) capture a first image via a first imaging component, the first image comprising a first component due to background illumination and a second component due to interaction of the probe radiation with the material of interest;
• c) stop emitting radiation for a second time period;
• d) capture a second image via a second imaging component, the second image substantially consisting of the first component;
• e) create a difference image corresponding to the difference between the first and second images, such that the difference image includes any features due to interaction of the probe radiation with the material of interest;
• wherein the system is further configured to display the difference image on the display;
• wherein the system is further configured to:
• repeat operations a) to e) so as to create a plurality of difference images;
• and
• display the plurality of difference images in real-time on the display.