Pressure detecting device
AssigneeNissha Co., Ltd.
InventorsYuji Watazu, Yosuke Shibata
Life of this patent
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Abstract
Each of a first electrode pattern Ty and a second electrode pattern Tx extends between third electrodes Rx neighboring in a Y direction among the plurality of third electrodes Rx so as to overlap only partly with each of the neighboring third electrodes Rx in a plan view. A microcontroller is configured to detect capacitance generated at those portions. The microcontroller is configured to calculate shear force based on a capacitance change obtained due to a change in an overlapping surface area between the third electrode Rx and the first electrode pattern Ty and the second electrode pattern Tx overlapping each other in a plan view, when a pressure is applied so that an insulator is deformed.
Claims11
A pressure detecting device comprising:
- a support substrate,
- a second insulator having a lower stiffness than the support substrate so as to be elastically deformed by a pressure,
- a first insulator, the support substrate, the second insulator, and the first insulator laminated in order from a side opposite to a pressure input side;
- a plurality of land-like electrodes arranged to cover an entire surface between the second insulator and the support substrate;
- a plurality of first belt-like electrodes extending in a first direction on a side of the first insulator opposite to the second insulator, each of the first belt-like electrodes extending along spaces between, among the plurality of land-like electrodes, land-like electrodes neighboring in a direction crossing the first direction so as to overlap only partly with each of the neighboring land-like electrodes in a plan view;
- a plurality of second belt-like electrodes extending in a second direction crossing the first direction between the first insulator and the second insulator, each of the second belt-like electrodes extending along spaces between, among the plurality of land-like electrodes, land-like electrodes neighboring in a direction crossing the second direction so as to overlap only partly with each of the neighboring land-like electrodes in a plan view;
- a capacitance measuring circuit configured to detect capacitance generated between each of the land-like electrodes and the corresponding first belt-like electrode overlapping each of the land-like electrodes in a plan view, and configured to detect capacitance generated between each of the land-like electrodes and the corresponding second belt-like electrode overlapping the land-like electrodes in a plan view;
- and
- a pressure calculating circuit configured to calculate shear force based on capacitance measurement results detected by the capacitance measuring circuit, due to a change in an overlapping surface area between the land-like electrodes and the corresponding first belt-like electrode overlapping each other in a plan view and/or an overlapping surface area between the land-like electrodes and the corresponding second belt-like electrode overlapping each other in a plan view, when a pressure is applied so that the second insulator is deformed.
Dependencies are inferred from the claim text.