Systems and methods for testing electronic devices using master-slave test architectures
AssigneeContec, LLC
InventorsIna Huh, Rajeev Tiwari, Jin Ryu
Life of this patent
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AssigneeContec, LLC
InventorsIna Huh, Rajeev Tiwari, Jin Ryu
Estimating the term…
A master test system may comprise cable modem termination systems, resource servers, provisioning/Session Initiation Protocol (SIP) servers, call management system (CMS) servers, Data over Cable Service Interface Specification/Wide Area Network (DOCSIS/WAN) servers, test controller servers, etc. Servers on the master test system may facilitate tests of devices under test (DUTs) coupled to the master test system. Servers on the master test system and/or slave test systems may facilitate tests of DUTs coupled to slave test systems that are coupled to the master test system. The slave test system(s) may comprise resource servers and test controller servers. In various implementations, the servers on the slave test system(s) may facilitate tests of DUTs coupled to the slave test system(s).
A testing network for testing a plurality of cable modems under test, the testing network comprising:
A testing network for testing a plurality of electronic devices under test, the testing network comprising:
Dependencies are inferred from the claim text.