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US 10,746,674 B2Granted
Combined scatter and transmission multi-view imaging system
AssigneeRapiscan Systems, Inc.
InventorEdward James Morton
Life of this patent
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Abstract
The present specification discloses a multi-view X-ray inspection system having, in one of several embodiments, a three-view configuration with three X-ray sources. Each X-ray source rotates and is configured to emit a rotating X-ray pencil beam and at least two detector arrays, where each detector array has multiple non-pixellated detectors such that at least a portion of the non-pixellated detectors are oriented toward both the two X-ray sources.
Claims21
An X-ray inspection system for scanning an object, the inspection system comprising:
- a first X-ray source configured to rotate and emit a first X-ray beam having a first transmission path defined by a first area;
- a second X-ray source configured to rotate and emit a second X-ray beam having a second transmission path defined by a second area, wherein the second X-ray source is positioned apart from the first X-ray source and wherein an overlap of the first area and the second area define an scanning area;
- a first detector array placed on an opposite side of the scanning area relative to the first X-ray source;
- a second detector array placed on an opposite side of the scanning area relative to the second X-ray source;
- and
- at least one controller configured to control a rotation of the first X-ray source and a rotation of the second X-ray source such that the first X-ray beam and second X-ray beam are concurrently activated but do not cross.
3 more elements
Dependencies are inferred from the claim text.