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US 10,746,568 B2Granted
Material tester
AssigneeShimadzu Corporation
InventorHiroshi Tsuji
Life of this patent
Estimating the term…
Abstract
Data output from each of the “n” delay elements and a remainder value output from a divider in the previous calculation are input to an adder, and an addition process for obtaining a total sum thereof is executed. In addition, a division process is performed by dividing the total sum output from the adder by “n,” and a quotient and a remainder are output from the divider. The remainder is delayed by a remainder delay element by one clock, is output to the adder, and is added in the next calculation.
Claims3
A material tester comprising:
- a noise removal filter to which data on a variation of a physical amount output from a sensor is input;
- an integrator configured to integrate data subjected to filtering of the filter;
- and
- a display unit configured to display the data,
- wherein a filter circuit of the filter has:
- “n” data delay elements cascaded to sequentially accumulate input data from the sensor,
- an adder configured to obtain a total sum of data output from each of the “n” delay elements,
- a divider configured to output a quotient value obtained by dividing an output of the adder by the number “n” of the delay elements as averaged data and output a remainder value, both of the quotient value and the remainder value being positive or negative values, and the divider being configured to output a remainder to a remainder delay element, the remainder being an absolute value of the remainder value and equal to or less than “½” of a divisor “n”, and
- a circuit configured to add an output of the remainder delay element to the adder.
6 more elements
Dependencies are inferred from the claim text.