Semiconductor device and method for manufacturing same
AssigneeSumitomo Electric Industries, Ltd.
InventorsShin Harada, Makoto Sasaki, Taro Nishiguchi, Kyoko Okita, Keiji Wada, Tomihito Miyazaki
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AssigneeSumitomo Electric Industries, Ltd.
InventorsShin Harada, Makoto Sasaki, Taro Nishiguchi, Kyoko Okita, Keiji Wada, Tomihito Miyazaki
Estimating the term…
A semiconductor device has a semiconductor layer and a substrate. The semiconductor layer constitutes at least a part of a current path, and is made of silicon carbide. The substrate has a first surface supporting the semiconductor layer, and a second surface opposite to the first surface. Further, the substrate is made of silicon carbide having a 4H type single-crystal structure. Further, the substrate has a physical property in which a ratio of a peak strength in a wavelength of around 500 nm to a peak strength in a wavelength of around 390 nm is 0.1 or smaller in photoluminescence measurement. In this way, the semiconductor device is obtained to have a low on-resistance.
A transistor having a current path, comprising:
Dependencies are inferred from the claim text.