Wafer scale image intensifier
AssigneeElbit Systems of America, LLC
InventorsArlynn W. Smith, Dan Chilcott
Life of this patent
Estimating the term…
Loading patent…
AssigneeElbit Systems of America, LLC
InventorsArlynn W. Smith, Dan Chilcott
Estimating the term…
A method of manufacturing a multi-layer image intensifier wafer includes fabricating first and second glass wafers, each having an array of cavities that extend between respective openings in first and second surfaces of the respective glass wafer; doping a semiconductor wafer to generate a plurality of electrons for each electron that impinges a first surface of the semiconductor wafer and to direct the plurality of electrons to a second surface of the semiconductor wafer, bonding a photo-cathode wafer to the first glass wafer; bonding the semiconductor wafer between the first and second glass wafers, and bonding the second glass wafer between the semiconductor wafer and an anode wafer (e.g., a phosphor screen or other electron detector). A section of the multi-layer image intensifier wafer may be sliced and evacuated to provide a multi-layer image intensifier.
A method, comprising:
A non-transitory computer readable medium encoded with a computer program, including instructions to cause a processor to control a manufacturing device to:
A wafer scale device comprising:
Dependencies are inferred from the claim text.