Back to results
US 10,722,201 B2Granted
Combination of an X-ray tube and a source grating with electron beam manipulation
AssigneeRensselaer Polytechnic Institute
InventorsGe Wang, Wenxiang Cong
Life of this patent
Estimating the term…
Abstract
Novel and advantageous systems and methods for performing X-ray imaging by using an X-ray source with source grating functionality incorporated therein are provided. An electron beam can be electromagnetically manipulated such that the X-ray source emits radiation in a pattern that is the same as if the radiation had already passed through a source grating.
Claims20
An imaging system, comprising:
- an X-ray source having source grating functionality incorporated therein, such that the X-ray source is configured to electromagnetically manipulate an electron beam therein such that the X-ray source emits X-ray radiation in a pattern that would have passed through a source grating whose functionality has been incorporated into the X-ray source;
- wherein the X-ray source is configured to split an electron beam into a plurality of beamlets such that each beamlet is narrower than each gap between the beamlets.
Dependencies are inferred from the claim text.