Device for measuring radiation backscattered by a sample and measurement method using such a device

Abstract

A device for measuring radiation backscattered by a sample including: at least one light source that is configured to emit a light beam, along an axis of incidence, towards a surface of the sample so as to form, on said surface, an elementary illumination zone; an image sensor for forming an image of the radiation backscattered by the sample when the latter is illuminated by the light source, the image sensor lying in a detection plane; a bundle of optical fibres, extending, along an extension axis, between a proximal surface and a distal surface, the proximal surface being applied against the image sensor, the distal surface being configured to be applied against the surface of the sample; wherein the light source is arranged around the bundle of optical fibres, and wherein the distance between the light source and the bundle of optical fibres is less than 1 mm.

Dependencies are inferred from the claim text.