Loading patent…
AssigneeMassachusetts Institute of Technology
InventorsLinh M. Pham, Carson Arthur Teale, Hannah A. Clevenson, Kerry Alexander Johnson, Christopher Michael McNally, John Francis Barry, Danielle Ann Braje
Estimating the term…
A magnetometer containing a crystal sensor with solid-state defects senses the magnitude and direction of a magnetic field. The solid-state defects in the crystal sensor absorb microwave and optical energy to transition between several energy states while emitting light intensity indicative of their spin states. The magnetic field alters the spin-state transitions of the solid-state defects by amounts depending on the solid-state defects' orientations with respect to the magnetic field. The optical read out, reporting the spin state of an ensemble of solid-state defects from one particular orientation class, can be used to lock microwave signals to the resonances associated with the spin-state transitions. The frequencies of the locked microwave signals can be used to reconstruct the magnetic field vector.
A method of measuring a magnetic field with a solid-state host disposed within the magnetic field, the solid-state host comprising a first ensemble of color centers oriented along a first crystal axis of the solid-state host, the first ensemble of color centers exhibiting a first resonance in a presence of the magnetic field, the method comprising:
A system for measuring a magnetic field, the system comprising:
Dependencies are inferred from the claim text.