System and method for near-field measurement of a device under test in a far-field environment
AssigneeRohde & Schwarz GmbH & Co. KG
InventorBenoit Derat
Life of this patent
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Abstract
A system for near-field measurement of a device under test in a far-field environment is provided. The system comprises a communication unit adapted to establish a far-field connection with the device under test. The system further comprises a measuring unit adapted to measure a magnitude and a phase of at least two field components. Moreover, the system comprises a processing unit adapted to perform far-field to near-field and/or near-field to near-field transformation of the field components in order to calculate field components at a specific surface in the near-field of the device under test.
Claims20
A system for near-field measurement of a device under test in a far-field environment comprising:
- a communication unit adapted to establish a far-field connection with the device under test;
- a measuring unit adapted to measure a magnitude and a phase of at least two field components;
- and
- a processing unit adapted to perform far-field to near-field and/or near-field to near-field transformation of the field components in order to calculate field components for a specific surface in the near-field of the device under test;
- and
- wherein the measuring unit is adapted to perform the measurement of the magnitude and the phase of the at least two field components either in the near-field or in the far-field of the device under test, where in both cases the measured field components are transformed into field components for the specific surface in the near-field of the device under test.
A method for near-field measurement of a device under test in a far-field environment comprises the steps of:
- establishing a far-field connection with the device under test;
- measuring a magnitude and a phase of at least two field components;
- and
- performing far-field to near-field and/or near-field to near-field transformation of the field components in order to calculate field components for a specific surface in the near-field of the device under test;
- and
- wherein the measurement of the magnitude and the phase of the at least two field components is performed either in the near-field or in the far-field of the device under test, where in both cases the measured field components are transformed into field components for the specific surface in the near-field of the device under test.
Dependencies are inferred from the claim text.