Method and apparatus for analog/digital conversion

A method for determining an optimized delay value of a comparator circuit of an asynchronous successive approximation analog/digital converter comprising a digital/analog converter and the comparator circuit, the method comprising:

• determining a suitability of at least two test delay values between comparator decisions of the comparator circuit of the asynchronous successive approximation analog/digital converter, wherein for each of the at least two test delay values, determining the suitability comprises performing the following steps to produce at least two corresponding digital test results:
• providing a respective test delay value of the at least two test delay values;
• converting a predetermined digital test value into an analog test signal using the digital/analog converter,
• approximating the analog test signal in a bit-by-bit manner using the asynchronous successive approximation analog/digital converter, and generating a corresponding digital test result of the at least two corresponding digital test results based on the approximating,
• determining whether the respective test delay value is a suitable delay value for operating the asynchronous successive approximation analog/digital converter, determining comprising comparing the corresponding digital test result with the predetermined digital test value;
• and
• determining the optimized delay value comprising comparing the at least two corresponding digital test results.

An apparatus for successive approximation analog/digital conversion, the apparatus comprising:

• a digital/analog converter;
• an asynchronous approximation register;
• a delay circuit;
• and
• a time calibration circuit, wherein the time calibration circuit is configured to:
• provide a test delay value,
• convert a predetermined digital test value into an analog test signal using the digital/analog converter,
• approximate the analog test signal in a bit-by-bit manner using digital/analog converter and the asynchronous approximation register, and generating a digital test result based on the approximating, and
• determine whether the test delay value is a suitable delay value for performing the successive approximation analog/digital conversion, determining comprising comparing the digital test result with the predetermined digital test value.

An apparatus for analog/digital conversion, the apparatus comprising:

• an asynchronous successive approximation analog/digital converter comprising:
• a digital/analog converter,
• an approximation register,
• a comparator circuit,
• an adjustable delay circuit configured to stipulate a delay between decisions of the comparator circuit, and
• a time calibration circuit;
• wherein the asynchronous successive approximation analog/digital converter is configured to:
• receive a predetermined digital test value and to convert the predetermined digital test value into an analog test signal using the digital/analog converter, and
• approximate the analog test signal in a bit-by-bit manner on based on a multiplicity of comparator decisions to provide a digital test result;
• and
• wherein the time calibration circuit is configured to compare the digital test result with the predetermined digital test value and to determine a suitability of at least one test delay value based on comparing the predetermined digital test value with the digital test result.