Integrated circuitry comprising an array, method of forming an array, method of forming DRAM circuitry, and method used in the fabrication of integrated circuitry
AssigneeMicron Technology, Inc.
InventorsCornel Bozdog, Abhilasha Bhardwaj, Byeung Chul Kim, Michael E. Koltonski, Gurtej S. Sandhu, Matthew Thorum
Life of this patent
Estimating the term…
Abstract
Integrated circuitry comprising an array comprises a plurality of conductive vias. Individual of the vias comprise an upper horizontal perimeter comprising opposing end portions. One of the opposing end portions comprises opposing straight sidewalls. The other of the opposing end portions comprises opposing curved sidewalls that join with the opposing straight sidewalls of the one opposing end portion. Other embodiments, including methods, are disclosed.
Claims26
A method of forming an array, comprising:
- forming rows of conductive vias over a substrate, the rows comprising a first series of the rows and a second series of the rows, individual of the conductive vias comprising first and second opposing upper end-walls;
- and
- selectively depositing a conductive material onto:
- the first upper end-walls of the individual conductive vias in the second series of the rows relative to the second upper end-walls of the individual conductive vias in the second series of the rows;
- and
- the second upper end-walls of the individual conductive vias in the first series of the rows relative to the first upper end-walls of the individual conductive vias in the first series of the rows.
A method of forming an array, comprising:
- forming rows of conductive vias over a substrate, individual of the conductive vias comprising first and second opposing upper end-walls;
- covering the first and second upper end-walls with a covering material;
- masking a first series of the rows with a first mask on the substrate to leave a second series of the rows unmasked;
- removing the covering material from and to expose the first upper end-walls in the unmasked second series of the rows while the first series of the rows is masked with the first mask;
- after removing the covering material from and to expose the first upper end-walls in the unmasked second series of the rows, removing the first mask and masking the second series of the rows with a second mask on the substrate to leave the first series of the rows unmasked;
- removing the covering material from and to expose the second upper end-walls in the unmasked first series of the rows while the second series of the rows is masked with the second mask;
- after removing the covering material from and to expose the second upper end-walls in the unmasked first series of the rows, removing the second mask;
- and
- after removing the first mask and the second mask and while the first and second series of the rows are exposed, selectively depositing a conductive material onto:
- the exposed first upper end-walls of the individual conductive vias in the second series of the rows relative to the covering material that covers the second upper end-walls of the individual conductive vias in the second series of the rows;
- and
- the exposed second upper end-walls of the individual conductive vias in the first series of the rows relative to the covering material that covers the first upper end-walls of the individual conductive vias in the first series of the rows.
A method used in the fabrication of integrated circuitry, comprising:
- forming an array of conductive vias in a first 2D horizontal lattice configuration, the array comprising a first series of rows of individual of the conductive vias and a second series of rows of the individual conductive vias, the individual vias comprising first and second opposing upper end-walls;
- selectively depositing a conductive material onto:
- the first upper end-walls of the individual conductive vias in the second series of rows relative to the second upper end-walls of the individual vias in the second series of rows;
- and
- the second upper end-walls of the individual conductive vias in the first series of rows relative to the first upper end-walls of the individual conductive vias in the first series of rows;
- and
- the selectively depositing forming a second 2D horizontal lattice configuration of the conductive material that is different from that of the first 2D horizontal lattice configuration.
Dependencies are inferred from the claim text.