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US 10,706,570 B2Granted
System and method to acquire the three-dimensional shape of an object using a moving patterned substrate
AssigneePhasica, LLC
InventorsWill Lohry, Samuel Robinson
Life of this patent
Estimating the term…
Abstract
A system and method for acquiring the three-dimensional shape of an object. At least one camera captures a scene in which a projected pattern is moved across an object and reference surface. The movement of said pattern need not be perfectly uniform, because differences in the movement at each step are detected and compensated. This compensation reduces the required hardware complexity and cost.
Claims15
A method for determining the three-dimensional geometry of an object, said method comprising:
- projecting a first pattern from a first region of a patterned substrate onto an object and onto a marker board to create a first projected pattern, wherein the marker board includes a printed pattern thereon having a known marker in a predetermined color;
- capturing the first projected pattern with a camera to produce a first image and storing the first image on a processor;
- using the printed pattern to determine the three-dimensional orientation of the marker board;
- changing the position of the patterned substrate relative to the projector;
- projecting a second pattern from a second region of said patterned substrate onto the object and onto the marker board to create a second projected pattern;
- capturing the second projected pattern with the camera to produce a second image and storing the second image on the processor;
- estimating the relative position of the patterned substrate by comparing the first image with the second image;
- using the first and second images captured on the processor and an interpolation algorithm to produce a temporally-simulated image which simulates an image captured when a third region of the patterned substrate is projected, wherein the simulated third region of the patterned substrate is between the first region and the second region;
- using a temporally-simulated image to compute relative and absolute phase and compute the three-dimensional geometry of the object by applying a phase shifting algorithm.
6 more elements
A method for determining the three-dimensional geometry of an object, said method comprising:
- projecting a first pattern from a first region of a patterned substrate onto an object and onto a reference surface to create a first projected pattern;
- capturing the first projected pattern with a camera to produce a first captured image and storing the first image on a processor;
- changing the position of the patterned substrate relative to the projector;
- projecting a second pattern from a second region of said patterned substrate onto the object and onto the reference surface to create a second projected pattern;
- capturing the second projected pattern with the camera to produce a second image and storing the second image on the processor;
- estimating the relative position of the patterned substrate by comparing a known marker on the first image with a known marker on the second image;
- using the first and second images captured on the processor and an interpolation algorithm to produce a temporally-simulated image which simulates an image captured when a third region of the patterned substrate is projected, wherein the simulated third region of the patterned substrate is between the first region and the second region;
- using a temporally-simulated image to compute relative and absolute phase and compute the three-dimensional geometry of the object by applying a phase shifting algorithm.
5 more elements
A method for determining the three-dimensional geometry of an object, said method comprising:
- projecting a first pattern from a first region of a patterned substrate onto an object to create a first projected pattern;
- capturing a first image of first projected pattern with a camera and storing the first image on a processor;
- using at least one marker projected by first region of said patterned substrate to create a mapping between the patterned substrate and camera image;
- changing the position of the patterned substrate relative to the projector;
- projecting a second pattern from a second region of said patterned substrate onto the object to produce a second projected pattern;
- capturing a second image of second projected pattern with the camera and storing the second image on the processor;
- estimating the relative position of the patterned substrate by comparing the first image with the second image;
- using the first and second images captured on the processor and an interpolation algorithm to produce a temporally-simulated image which simulates an image captured when a third region of the patterned substrate is projected, wherein the simulated third region of the patterned substrate is between the first region and the second region;
- using at least one temporally-simulated image to compute relative and absolute phase and compute the three-dimensional geometry of the object by applying a phase shifting algorithm.
6 more elements
Dependencies are inferred from the claim text.