Analog circuit fault mode classification method

An analog circuit fault mode classification method, comprising:

• (1) collecting M groups of voltage signal sample vectors Vij at a node to be tested under each of fault modes Fi of the analog circuit by using a data collection board, wherein j=1, 2, . . . , M, i=1, 2, . . . , N, Vij represents a jth voltage signal sample vector of a ith fault mode, and N represents a total number of the fault modes;
• (2) sequentially extracting fault characteristic vectors VijF of the voltage signal sample vectors Vij working under the fault modes Fi by using subspace projection, wherein i=1, 2, . . . , N, j=1, 2, . . . , M, and VijF represents a fault characteristic vector of the jth voltage signal sample under the ith fault mode;
• (3) standardizing the extracted fault characteristic vectors VijF to obtain standardized fault characteristic vectors {circumflex over (V)}ijF, wherein a computing method for obtaining the standardized fault characteristic vectors is
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• (4) sequentially constructing a binary-class support vector machine with respect to two different fault modes Fi1 and Fi2, wherein i1=1, 2, . . . , N, i2=1, 2, . . . , N, and i1≠i2, N is the total number of the fault modes, then N(N−1)/2 different binary-class support vector machines can be constructed in total;
• and
• (5) classifying a standardized fault characteristic vectors to be tested to obtain a classification result by simultaneously feeding a standardized fault characteristic to be tested into the N(N−1)/2 binary-class support vector machines in response to the fault mode to be tested is classified to the fault mode Fi by the binary-class support vector machine and i=1, 2, . . . , N, adding 1 to the votes of the fault mode Fi, and, determining the fault modes having most votes is a circuit to be tested belongs to.