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AssigneeKabushiki Kaisha Nihon Micronics
InventorsYuki Sato, Kazuyuki Tsunokuni, Tomokazu Saito
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An intermediate structure unit for a secondary cell according to the present invention is the intermediate structure unit for a secondary cell having a secondary cell and a test structure unit on a common substrate. Each of the secondary cell and the test structure unit includes a first electrode layer and a second electrode layer. A plurality of layers are layered at the secondary cell between the first electrode layer and the second electrode layer. The plurality of layers include at least a metal oxide semiconductor layer and a charging layer. A party of the plurality of layers is formed at the test structure unit between the first electrode layer and the second electrode layer.
An intermediate structure unit for a secondary cell, comprising one or more secondary cells and one or more test structure units, arranged on a common substrate, wherein each of the secondary cell and the test structure unit includes a first electrode layer and a second electrode layer, the first electrode layers are formed in an integrated pattern for the secondary cell and the test structure unit, the second electrode layers are separated between the secondary cell and the test structure unit, a plurality of layers are layered at the secondary cell between the first electrode layer and the second electrode layer, the plurality of layers includes at least a metal oxide semiconductor layer and a charging layer, and wherein there are fewer layers between the first electrode layer and the second electrode layer of the test structure unit in comparison to the secondary cell.
Dependencies are inferred from the claim text.