Techniques for testing PLP capacitors
AssigneeToshiba Memory Corporation
InventorsPaul Abrahams, Ilya Shlimenzon
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AssigneeToshiba Memory Corporation
InventorsPaul Abrahams, Ilya Shlimenzon
Estimating the term…
A solid state drive (SSD) with improved techniques for testing power loss protection (PLP) capacitors and a method for testing PLP capacitors of SSDs is disclosed. In one embodiment, the SSD includes a memory controller and one or more non-volatile memory devices and a volatile memory device coupled to the memory controller. The SSD also includes a PLP capacitor configured to supply a first voltage to the memory controller, the one or more non-volatile memory devices, and the volatile memory device in the event of a power loss or failure of the SSD. In one embodiment, the PLP capacitor is further configured to increase the first voltage to a second voltage prior to testing the PLP capacitor. In another embodiment, the memory controller is configured to reduce a volume of data stored in the volatile memory device prior to testing the PLP capacitor.
A solid state drive (SSD) comprising:
A method for testing a power loss protection (PLP) capacitor of a solid state drive (SSD), the method comprising:
Dependencies are inferred from the claim text.