Shrouded test probe

A test probe comprising:

• an electrically insulating handle;
• a first electrically conducting blade extending from the handle;
• a second electrically conducting blade extending from the handle;
• an electrically insulating material disposed between the first blade and the second blade;
• an electrically insulating shroud including a first portion and a second portion that are at least partially disposed around the first electrically conducting blade, the second electrically conducting blade, and the electrically insulating material;
• a housing attached to the handle, the first portion of the shroud being disposed within the housing, and the second portion of the shroud extending from an aperture formed in the housing;
• a first spring disposed between the handle and the shroud;
• and a second spring disposed between the handle and the shroud, the first spring and the second spring biasing the shroud toward the aperture formed in the housing, wherein the second portion of the shroud includes a plurality of projections, each of the projections extending inwardly from an interior surface of the second portion of the shroud.

A test probe comprising:

• an electrically insulating handle, a first electrically conducting blade extending from the handle;
• a second electrically conducting blade extending from the handle;
• an electrically insulating material disposed between the first blade and the second blade, an electrically insulating shroud including a first portion and a second portion that are at least partially disposed around the first electrically conducting blade, the second electrically conducting blade, and the electrically insulating material;
• a housing attached to the handle, the first portion of the shroud being disposed within the housing, and the second portion of the shroud extending from an aperture formed in the housing;
• a first spring disposed between the handle and the shroud;
• and a second spring disposed between the handle and the shroud, the first spring and the second spring biasing the shroud toward the aperture formed in the housing, wherein:
• the handle includes an electrically insulating base portion having a recess extending into the base portion at a first end thereof, a first projection and a second projection that extend from the base portion are disposed within the recess, the first spring is partially disposed within an aperture formed in the first projection, and the second spring is partially disposed within an aperture formed in the second projection.