Probe assembly and probe structure thereof
AssigneeChunghwa Precision Test Tech. Co., Ltd.
InventorsWen-Tsung Lee, Kai-Chieh Hsieh, Yuan-Chiang Teng
Life of this patent
Estimating the term…
Abstract
A probe component and a probe structure thereof are provided. The probe structure includes a first contacting segment, a first connecting segment, a second connecting segment and a second contacting segment. The first contacting segment has an abutting portion and a first end portion connected to the abutting portion. The first connecting segment is connected to the first contacting segment. The second connecting segment is connected to the first connecting segment. The second contacting segment is connected to the second connecting segment and has a second end portion.
Claims9
A probe structure, comprising:
- a first contacting segment having an abutting portion and a first end portion connected to the abutting portion;
- a first connecting segment connected to the first contacting segment, wherein the first connecting segment forms an exposed surface relative to the second connecting segment;
- a second connecting segment connected to the first connecting segment;
- and
- a second contacting segment connected to the second connecting segment, the second contacting segment having a second terminal end;
- wherein a cross section of the first connecting segment is perpendicular to an extension direction of the first connecting segment, a cross section of the second connecting segment is perpendicular to an extension direction of the second connecting segment, and a shape of the cross section of the first connecting segment and a shape of the cross section of the second connecting segment are different;
- wherein an area of the cross section of the first connecting segment is larger than an area of the cross section of the second connecting segment;
- wherein the first contacting segment and the first connecting segment extend towards a first direction, the second connecting segment extends towards a second direction, and the first direction and the second direction are different;
- wherein a connection between the first connecting segment and the second connecting segment is a turning segment, and the turning segment has the exposed surface.
A probe component, including:
- a substrate having a plurality of conductive structures;
- a first plate having a plurality of first through holes and a plurality of abutting parts, each of the abutting parts being adjacent to one of the first through holes corresponding thereto, each of the first through holes having a first aperture;
- and
- a plurality of probe structures, each of the plurality of probe structures including a first contacting segment, a first connecting segment, a second connecting segment and a second contacting segment, wherein the first contacting segment has an abutting portion and a first end portion connected to the abutting portion, the first connecting segment being connected to the first contacting segment, the second connecting segment being connected to the first connecting segment, the second contacting segment being connected to the second connecting segment, the second contacting segment having a second end portion;
- wherein a maximum outer diameter of the first contacting segment is smaller than the first aperture of the first through hole for enabling the first contacting segment to pass through the first through hole;
- wherein the first end portion of the first contacting segment of each of the probe structures abuts against the conductive structures corresponding thereto;
- wherein the abutting portion of the first contacting segment of each of the probe structures abuts against the abutting part corresponding thereto;
- wherein the first contacting segment of each of the probe structures abuts against between the corresponding conductive structures and the corresponding abutting part.
Dependencies are inferred from the claim text.