Intelligent processing modulation system and method

An intelligent processing modulation method comprising:

• detecting, by a detector, wear and tear of a processing equipment and detecting at least one condition of an environment in which the processing equipment is placed before a process for processing a raw material into a product begins;
• recording in a data storage at least one specification of the raw material, at least one ingredient of the raw material and at least one processing parameter of the raw material and at least one method for processing the raw material;
• applying the processing equipment to perform the process;
• storing, in a basic database, first information of the detector corresponding to the product, second information of the data storage corresponding to the product and a condition of the product for each time the process is completed;
• receiving, by a mode database, the first information of the detector, the second information of the data storage and third information of the basic database, and setting up a processing model accordingly and recording a defect condition of the product and a yield condition of the product for each time the process is completed;
• receiving, by a processing information manager, parameter information of the processing model of the mode database and connect to the processing equipment;
• and
• transmitting, by the mode database, the parameter information of the processing model of the mode database to the processing information manager, with the processing equipment operating according to information received by the processing information manager to process the raw material and the processing equipment transmitting the first information of the detector corresponding to the product, the second information of the data storage corresponding to the product and the condition of the product to the basic database for each time the process is completed and the basic database storing the first information, the second information and the condition of the product, the mode database records the defect condition of the product and the yield condition of the product generated for each time the process is completed, and when the product has more defects, the processing information manager modifies the parameter information of the processing model promptly according to the parameter information of the processing model corresponding to the product having fewer defects recorded in the mode database, and the processing equipment operates accordingly to obtain the product having fewer defects.