Sample holder and lock-in thermography system with such

A lock-in thermography system for examining thermal radiation signals of magnetic nanoparticle samples, comprising a sample holder for holding a plurality of magnetic nanoparticle samples and for usage in a lock-in thermography system, comprising:

• a plurality of sample wells distributed on a top surface of the sample holder, wherein each of the sample wells is adapted to hold a magnetic nanoparticle sample consisting of a plurality of magnetic nanoparticles embedded in a medium, wherein the sample wells are distributed on the top surface such that a first distance between neighboring samples wells and/or a second distance between each peripheral sample well and a respective edge of the top surface of the sample holder and/or a third distance between a deepest point of the sample wells and a bottom of the sample holder is between 1 and 100 times greater, than a thermal diffusion length of the sample holder material, and wherein the thermal diffusion length is
• λ2
• =
• 2
• ⁢
• k
• 2
• ⁢
• πρ
• ⁢
• ⁢
• cf
• where k is the sample thermal conductivity in [W/m/° C.], p is the sample density in [kg/m3], c is the sample heat capacity in [kJ/kg/° C.], and f is frequency at which the amplitude of the AMF is modulated in [Hz] and further comprising:
• a coil surrounding at least partially the sample holder,
• a generator for generating an alternating magnetic field by the coil,
• a thermal imaging device for detecting a thermal radiation of at least one of the magnetic nanoparticle samples arranged in the sample holder, wherein the thermal radiation is a result of the alternating magnetic field,
• an image processing device connected to the thermal imaging device, for capturing and processing images generated by said thermal imaging device.