Measurement time distribution in referencing schemes
AssigneeApple Inc.
InventorsRobert Chen, Trent D. Ridder, Miikka M. Kangas, David I. Simon, Matthew A. Terrel
Life of this patent
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AssigneeApple Inc.
InventorsRobert Chen, Trent D. Ridder, Miikka M. Kangas, David I. Simon, Matthew A. Terrel
Estimating the term…
Methods and systems for measurement time distribution for referencing schemes are disclosed. The disclosed methods and systems can be capable of dynamically changing the measurement time distribution based on the sample signal, reference signal, noise levels, and SNR. The methods and systems can be configured with a plurality of measurement states, including a sample measurement state, reference measurement state, and dark measurement state. In some examples, the measurement time distribution scheme can be based on the operating wavelength, the measurement location at the sampling interface, and/or targeted SNR. Examples of the disclosure further include systems and methods for measuring the different measurement states concurrently. Moreover, the systems and methods can include a high-frequency detector to eliminate or reduce decorrelated noise fluctuations that can lower the SNR.
A system for determining a concentration and a type of substance in a sample at a sampling interface, the system comprising:
A method of determining a concentration and a type of substance in a sample at a sampling interface during a plurality of cycles, the plurality of cycles including a first cycle and a second cycle, the method comprising:
A system for determining a concentration and type of substance in a sample site including a sampling interface, the system comprising:
Dependencies are inferred from the claim text.