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US 10,684,324 B1Granted
IC device authentication using energy characterization
AssigneeSaic
InventorDavid Michael Barrett
Life of this patent
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Abstract
Systems, methods, and apparatuses are described for verifying the authenticity of an integrated circuit device. An integrated test apparatus may use quiescent current and/or conducted electromagnetic interference readings to determine if a device under test matches the characteristics of an authenticated device. Deviations from the characteristics of the authenticated device may be indicative of a counterfeit device.
Claims20
A method comprising:
- determining, based on application of a first voltage to an unauthenticated integrated circuit (IC) device, a first quiescent current (QC) reading for the unauthenticated IC device;
- determining, based on the first QC reading, a first tested QC value;
- determining, after determining the first QC reading and by application of a second voltage to the unauthenticated IC device, a second QC reading for the unauthenticated IC device;
- determining, based on the second QC reading, a second tested QC value;
- determining, based at least in part on:
- a first difference between the first tested QC value and a first expected QC value of one or more expected QC values associated with an authenticated IC device, and
- a second difference between the second tested QC value and a second expected QC value of the one or more expected QC values,
- one or more variability values;
- determining, based at least in part on the one or more variability values, that a threshold is not satisfied;
- and
- outputting an indication that the threshold is not satisfied.
8 more elements
A method comprising:
- applying, while applying a steady-state voltage to an unauthenticated integrated circuit (IC) device, an excitation signal to an input of the unauthenticated IC device;
- detecting, using a voltage detector that is in-line with a Vcc connection of the unauthenticated IC device, and based on the applied steady-state voltage and the applied excitation signal, a tested conducted electromagnetic interference (EMI) value of the unauthenticated IC device;
- determining, based on a difference between the tested conducted EMI value and an expected conducted EMI value, that a threshold is not satisfied, wherein the expected conducted EMI value is associated with an authenticated IC device;
- and
- outputting an indication that the threshold is not satisfied.
2 more elements
A method comprising:
- determining, based at least in part on a first difference between a first tested quiescent current (QC) value and a first expected QC value, and a second difference between a second tested QC value and a second expected QC value, that a first threshold is not satisfied, wherein the first tested QC value and the second tested QC value are associated with an unauthenticated integrated circuit (IC) device, and wherein the first expected QC value and the second expected QC value are associated with an authenticated IC device;
- determining, using a voltage detector that is in-line with a Vcc connection of the unauthenticated IC device, a tested conducted electromagnetic interference (EMI) value;
- determining, based on a difference between the tested conducted EMI value and an expected conducted EMI value, that a second threshold is not satisfied, wherein the tested conducted EMI value is associated with the unauthenticated IC device, and wherein the expected conducted EMI value is associated with the authenticated IC device;
- and
- outputting, based on determining that at least one threshold of the first threshold or the second threshold is not satisfied, an indication that the at least one threshold is not satisfied.
2 more elements
Dependencies are inferred from the claim text.