# US 10,672,746 B2 · Integrated circuit formed from a stack of two series-connected chips > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 10,672,746 B2 - Document ID: US10672746B2 - Status: Granted - Kind: B2 - Application number: 16/463,809 - Filed: 2017-11-20 - Published: 2019-12-12 - Granted: 2020-06-02 - Earliest claimed: 2016-11-23 - Assignees: Exagan - Applicants: Exagan - Inventors: Domenico Lo Verde; Laurent Guillot; Fabrice Letertre - Web page: https://patentgrep.com/patent/US10672746B2 ## CPC - H10W 70/658: {for devices provided for in groups H10D8/00 - H10D48/00} - H10W 90/00: Package configurations - H10W 70/481: {for devices being provided for in groups H10D8/00 - H10D48/00} - H10W 90/811: {Multiple chips on leadframes} - H10W 72/5473: {multiple bond wires connected to a common bond pad} - H10W 72/879: {Bump connectors and bond wires} - H10W 72/926: {Multiple bond pads having different sizes} - H10W 90/722: {between stacked chips} - H10W 90/752: {between stacked chips} - H10W 90/756: {between a chip and a stacked lead frame, conducting package substrate or heat sink} - H10W 90/762: {between stacked chips} - H10W 90/792: {between multiple chips} - H10W: GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10 ## Abstract An integrated circuit includes a first chip including a high-voltage depletion-mode transistor and a second chip including an enhancement-mode device. The chips have first and second gate contact pads, first and second source contact pads and first and second drain contact pads, respectively, on their front sides. Chips are joined together via their front sides, and the area of the first chip is larger than that of the second chip. The first chip includes an additional contact pad on its front side that is electrically insulated from the high-voltage depletion-mode transistor and that contacts the second gate contact pad. The first gate contact pad contacts the second source contact pad and/or the first source contact pad contacts the second drain contact pad. The first gate contact pad and the additional contact pad extend at least partially into a peripheral portion of the first chip. ## Claims ### Claim 1 An integrated circuit, comprising: a first chip including a high-voltage depletion-mode transistor, the first chip having, on a front side thereof, a first gate and first source and drain contact pads; and a second chip including an enhancement-mode device, the second chip having, on a front side thereof, a second gate and second source and drain contact pads; wherein: the first chip and the second chip are joined to each other at their respective front sides and form a stack, the surface of the front side of the first chip being larger than that of the second chip so that a peripheral portion of the front side of the first chip is not masked by the second chip, the first chip includes at least one additional contact pad on its front side, the at least one additional contact pad being electrically insulated from the high voltage depletion-mode transistor, the at least one additional contact pad being in contact with the second gate contact pad, the first gate contact pad being in contact with the second source contact pad and/or the first source contact pad being in contact with the second drain contact pad, and the first gate contact pad and the at least one additional contact pad extend at least partially into the peripheral portion of the first chip. ### Claim 2 (depends on 1) The integrated circuit of claim 1, further comprising a housing having at least three electrical terminals including a gate terminal, a source terminal and a drain terminal, and wherein a rear side of the first chip is placed on a structural plate of the housing connected to the source terminal. ### Claim 3 (depends on 2) The integrated circuit of claim 2, wherein the first gate contact pad is in contact with the second source contact pad, and the first gate contact pad extends over an active region of the transistor of the first chip and forms a main assembly surface between the first chip and the second chip. ### Claim 4 (depends on 3) The integrated circuit of claim 3, wherein the second drain contact pad is on a rear side of the second chip, the second drain contact pad is connected to the first source contact pad by an electrical connection clip, and the first source contact pad is located in the peripheral portion. ### Claim 5 (depends on 2) The integrated circuit of claim 2, wherein the first source contact pad, is in contact with the second drain contact pad, the first source contact pad extends over an active region of the transistor of the first chip, and the first source contact pad forms a main assembly surface between the first chip and the second chip. ### Claim 6 (depends on 5) The integrated circuit of claim 5, wherein the second source contact pad is on a rear side of the second chip, and the second source contact pad is connected to the first gate contact pad by an electrical connection clip. ### Claim 7 (depends on 5) The integrated circuit of claim 5, wherein the second source contact pad is on the front side of the second chip, and the second source contact pad is in contact with the first gate contact pad. ### Claim 8 (depends on 4) The integrated circuit of claim 4, wherein the at least one additional contact pad, the first gate contact pad and the first drain contact pad are connected to the gate terminal, the source terminal and the drain terminal respectively. ### Claim 9 (depends on 8) The integrated circuit of claim 8, wherein at least the connection between the first gate contact pad and the source terminal, and the connection between the first drain contact pad and the drain terminal are provided by electrical connection clips. ### Claim 10 (depends on 9) The integrated circuit of claim 9, wherein the connection between the first gate contact pad and the source terminal is provided by an electrical connection clip between the structural plate of the housing and the first gate contact pad, and the source terminal is electrically connected to the structural plate. ### Claim 11 (depends on 8) The integrated circuit of claim 8, wherein the connection between the additional contact pad and the gate terminal is provided by a wire connection or an electrical connection clip. ### Claim 12 (depends on 1) The integrated circuit of claim 1, further comprising a housing having at least four electrical terminals including a gate terminal, a source terminal, a drain terminal and an additional gate terminal, and wherein a rear side of the first chip is placed on a structural plate of the housing connected to the source terminal. ### Claim 13 (depends on 12) The integrated circuit of claim 12, wherein the first chip has a supplementary additional contact pad on its front side, the supplementary additional contact pad being electrically insulated from the high voltage depletion-mode transistor, the supplementary additional contact pad extending at least partially in the peripheral portion of the first chip. ### Claim 14 (depends on 13) The integrated circuit of claim 13, wherein the first source contact pad is in contact with the second drain contact pad, and the first source contact pad extends over an active region of the transistor of the first chip and forms a main assembly surface between the first chip and the second chip. ### Claim 15 (depends on 13) The integrated circuit of claim 13, wherein the second source contact pad is on the front side of the second chip, and is in contact with the supplementary additional contact pad. ### Claim 16 (depends on 15) The integrated circuit of claim 15, wherein the additional contact pad, the supplementary additional contact pad, the first drain contact pad and the first gate contact pad are respectively connected to the gate terminal, the source terminal, the drain terminal and the additional gate terminal. ### Claim 17 (depends on 16) The integrated circuit of claim 16, wherein at least the connection between the supplementary additional contact pad and the source terminal and the connection between the first drain contact pad and the drain terminal are provided by electrical connection clips. ### Claim 18 (depends on 17) The integrated circuit of claim 17, wherein the connection between the supplementary additional contact pad and the source terminal is provided by an electrical connection clip between the structural plate of the housing and the supplementary additional contact pad, and the source terminal is electrically connected to the structural plate. ### Claim 19 (depends on 16) The integrated circuit of claim 16, wherein the connection between the additional contact pad and the gate terminal and the connection between the first gate contact pad and the additional gate terminal are provided by wire connections or electrical connection clips. ### Claim 20 (depends on 1) The integrated circuit of claim 1, wherein the enhancement-mode device of the second chip comprises an enhancement-mode transistor and a gate electrode, is the gate electrode of the enhancement-mode device being connected to the gate contact pad of the second chip. ### Claim 21 (depends on 1) The integrated circuit of claim 1, wherein the enhancement-mode device of the second chip comprises an enhancement-mode transistor and a control component, a gate electrode of the enhancement-mode transistor being connected to an input of the control component, and an output of the control component being connected to the gate contact pad of the second chip.