Measurement system and calibration method with wideband modulation
AssigneeMaury Microwave, Inc.
InventorsGary R. Simpson, Sathya Padmanabhan, Steven M. Dudkiewicz, M. Tekamül Büber, Giampiero Esposito
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Abstract
A load pull system and method for calibrating the system and conducting measurements on a Device Under Test (DUT). The system includes at least one passive tuner; and a modulated signal connected to the DUT input. The passive tuner is calibrated at multiple frequencies within the modulation bandwidth of the modulated signal. The impedance and measured quantities such as power at the DUT reference plane are determined using tuner s-parameters at multiple frequencies within the modulation bandwidth.
Claims25
A load pull system for conducting measurements on a Device Under Test (DUT), comprising:
- at least one passive impedance tuner calibrated at multiple frequencies within a modulation band:
- a modulated source signal having the modulation band centered at a center frequency, the modulated source signal connected to a DUT input,
- at least one signal measurement instrument, including an instrument configured to receive output signals from the DUT and to measure signals at separate frequencies within the modulation band;
- a memory for storing a calibration data set, said calibration data set including calibration data for said passive impedance tuner at said multiple frequencies within the modulation band of said modulated source signal;
- a controller configured to control the passive impedance tuner to set the passive impedance tuner at different impedance states;
- wherein the measurements on the DUT include measurements resulting from said modulated source signal at one or more frequencies within the modulation band;
- and
- wherein the controller is configured to de-embed said measurements to a DUT reference plane at one or more frequencies within the modulation band.
A load pull system for conducting measurements on a Device Under Test (DUT), comprising:
- at least one passive impedance tuner calibrated at multiple frequencies within a modulation band;
- a modulated source signal having the modulation band centered at a center frequency, the modulated source signal connected to a DUT input,
- at least one signal measurement instrument, including an instrument configured to receive output signals from the DUT and to measure signals at separate frequencies within the modulation band:
- a calibration data set including calibration data for said at least one passive impedance tuner at said multiple frequencies within the modulation band of said modulated source signal;
- a controller configured to control the passive tuner to set the tuner at different impedance states;
- wherein the measurements on the DUT include measurements resulting from said modulated source signal at one or more frequencies within the modulation band.
Dependencies are inferred from the claim text.