Semiconductor device and method of manufacturing the same
AssigneeRenesas Electronics Corporation
InventorsYuya Abiko, Natsuo Yamaguchi, Satoshi Eguchi
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AssigneeRenesas Electronics Corporation
InventorsYuya Abiko, Natsuo Yamaguchi, Satoshi Eguchi
Estimating the term…
In a vertical power MOSFET having a superjunction structure, the withstand voltage of the power MOSFET can be ensured even if the aspect ratios of an n-type column region and a p-type column region are increased so as to vary the impurity concentration of the p-type column region. P-type semiconductor regions PR1 are formed on the sides of an n-type column NC1 adjacent to a p-type column region PC1. In this configuration, the p-type semiconductor region PR1 is formed from the upper end of the n-type column region NC1 to about a half depth of a height from the upper end to the lower end of the side of the n-type column region NC1. This inclines the sides of the overall p-type column region including the p-type semiconductor regions PR1 and the p-type column region PC1.
A method of manufacturing a semiconductor device, comprising the steps of:
A method at manufacturing a semiconductor device, comprising the steps of:
Dependencies are inferred from the claim text.