Apparatus for and method of mass analysis
AssigneeHitachi High-Tech Science Corporation
InventorsMasahiro Sakuta, Yoshiki Matoba
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AssigneeHitachi High-Tech Science Corporation
InventorsMasahiro Sakuta, Yoshiki Matoba
Estimating the term…
Disclosed is an apparatus for and a method of mass analysis, the apparatus and the method being capable of improving a detection accuracy of a target substance including impurities, without increasing a size of the apparatus, and shortening measuring time. The apparatus analyzing a sample containing a target substance and one or more interfering substances, which have a peak of a mass spectrum overlapping that of the target substance includes: a peak correction unit calculating an intensity of net peak D of the mass spectrum of the target substance by subtracting a total sum of estimated intensities of the peak B, which are calculated every predetermined time interval according to the intensity of the peak A and a nonlinear relation F between the peak A and the peak B, from an intensity of peak C of a mass spectrum of the target substance of the sample.
An apparatus for mass analysis, the apparatus analyzing a sample containing a target substance, which is an organic compound, and one or more interfering substances, which are organic compounds and have a peak of a mass spectrum overlapping that of the target substance, the apparatus comprising:
A method of mass analysis, the method analyzing a sample containing a target substance, which is an organic compound, and one or more interfering substances, which are an organic compound and have a peak of a mass spectrum overlapping that of the target substance, the method comprising:
Dependencies are inferred from the claim text.