Semiconductor device and system including the same
AssigneeSK hynix Inc.
InventorYoung Mok Jung
Life of this patent
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Abstract
A semiconductor device and a system including the semiconductor device are disclosed, which relate to a technology for detecting a defective or failed part during a probe test of the semiconductor device. The semiconductor device includes a test controller configured to perform counting of a read flag signal during activation of a test signal and to control a data mask signal to be toggled at an N-th activation time of the read flag signal. The semiconductor device further includes a cell array configured to receive and store an output signal of the test controller through a data line during a write operation and to output the stored data to a test device during a read operation.
Claims20
A semiconductor device comprising:
- a test controller configured to perform counting of a read flag signal during activation of a test signal for testing a defective part of a data line, and to control a data mask signal to be toggled at an N-th activation time of the read flag signal;
- and
- a cell array configured to receive and store an output signal of the test controller through a data line during a write operation, and to output the stored data to a test device during a read operation.
A system comprising:
- a semiconductor device configured to perform counting of a read flag signal during activation of a test signal for testing a defective part of a data line, and to transmit a data mask signal to be toggled at an N-th activation time of the read flag signal to a cell array through a data line;
- and
- a test device configured to output the test signal to the semiconductor device, and to test a failed part of data received from the semiconductor device.
Dependencies are inferred from the claim text.