Inspection apparatus, image sensing apparatus, electronic equipment, and transportation equipment
AssigneeCanon Kabushiki Kaisha
InventorKoichi Iwao
Life of this patent
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Abstract
An inspection apparatus includes a plurality of BIST circuits, each BIST circuit being configured to compare a test pattern output from an inspection target circuit with an expected value and output a signal indicating a comparison result, and a combining unit configured to generate one signal by performing a logical operation on a plurality of the signals indicating the comparison results which are output from the plurality of BIST circuits. The combining unit includes a plurality of level inspection circuits each configured to perform a level inspection of detecting a stuck-at fault. Each of the plurality of BIST circuits is connected to a corresponding one of the plurality of level inspection circuits.
Claims14
An inspection apparatus comprising:
- a plurality of BIST circuits, each BIST circuit being configured to compare a test pattern output from an inspection target circuit with an expected value and output a signal indicating a comparison result;
- and
- a combining unit configured to generate one signal by performing a logical operation on a plurality of the signals indicating the comparison results which are output from the plurality of BIST circuits,
- wherein the combining unit includes a plurality of level inspection circuits each configured to perform a level inspection of detecting a stuck-at fault, and
- each of the plurality of BIST circuits is connected to a corresponding one of the plurality of level inspection circuits.
Dependencies are inferred from the claim text.